Granted Patent
Utility
US 6,606,148 · App. 09/840,060
Method and system for measuring optical scattering characteristics
Inventors:
Leif Fredin, Robert C. Chin, William H. Hallidy
Patented Case
View Patent ↗
Granted: Aug 12, 2003
Filed: Apr 23, 2001
Inventors
Leif Fredin
Robert C. Chin
William H. Hallidy
Assignee (at issue)
Systems & Processes Engineering Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.