Granted Patent
Utility
US 6,614,252 · App. 09/911,342
Semiconductor test apparatus with reduced power consumption and heat generation
Inventor:
Nobuaki Takeuchi
Patented Case
View Patent ↗
Granted: Sep 2, 2003
Filed: Jul 23, 2001
Inventor
Nobuaki Takeuchi
Assignee (at issue)
Ando Electric Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.