IP Library › Granted Patent US 6,614,287
Granted Patent Utility
US 6,614,287 · App. 10/217,926

Calibration technique for delay locked loop leakage current

Inventors: Claude Gauthier, Pradeep Trivedi, Brian Amick, Dean Liu
Patented Case View Patent ↗
Granted: Sep 2, 2003 Filed: Aug 13, 2002
Inventors
Claude Gauthier
Pradeep Trivedi
Brian Amick
Dean Liu
Assignee (at issue)
Sun Microsystems Inc.

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Quick Facts
Patent No.
US 6,614,287
App. No.
10/217,926
Filed
2002-08-13
Granted
2003-09-02
Kind
B1