Granted Patent
Utility
US 6,621,280 · App. 09/603,717
Method of testing an integrated circuit
Inventors:
Vivian W. Ryan, Thomas H. Shilling
Patented Case
View Patent ↗
Granted: Sep 16, 2003
Filed: Jun 27, 2000
Inventors
Vivian W. Ryan
Thomas H. Shilling
Assignee (at issue)
Agere Systems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.