IP Library › Granted Patent US 6,651,226
Granted Patent Utility
US 6,651,226 · App. 09/967,114

Process control using three dimensional reconstruction metrology

Inventors: Erik Cho Houge, John M. McIntosh, Larry E. Plew
Patented Case View Patent ↗
Granted: Nov 18, 2003 Filed: Sep 28, 2001
Inventors
Erik Cho Houge
John M. McIntosh
Larry E. Plew
Assignee (at issue)
Agere Systems Inc.

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Quick Facts
Patent No.
US 6,651,226
App. No.
09/967,114
Filed
2001-09-28
Granted
2003-11-18
Kind
B2