Granted Patent
Utility
US 6,665,214 · App. 10/200,330
On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode
Inventors:
Ken Cheong Cheah, Edward V. Bautista, Jr., Weng Fook Lee, Boon Tang Teh
Patented Case
View Patent ↗
Granted: Dec 16, 2003
Filed: Jul 22, 2002
Inventors
Ken Cheong Cheah
Edward V. Bautista, Jr.
Weng Fook Lee
Boon Tang Teh
Assignee (at issue)
Advanced Micro Devices, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.