IP Library › Granted Patent US 6,680,996
Granted Patent Utility
US 6,680,996 · App. 10/078,640

Dual-wavelength X-ray reflectometry

Inventors: Boris Yokhin, Isaac Mazor, Amos Gvirtzman
Patented Case View Patent ↗
Granted: Jan 20, 2004 Filed: Feb 19, 2002
Inventors
Boris Yokhin
Isaac Mazor
Amos Gvirtzman
Assignee (at issue)
Jordan Valley Applied Radiation Ltd.

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Quick Facts
Patent No.
US 6,680,996
App. No.
10/078,640
Filed
2002-02-19
Granted
2004-01-20
Kind
B2