Granted Patent
Utility
US 6,682,945 · App. 09/865,957
Wafer level burn-in and electrical test system and method
Inventors:
Donald P. Richmond, II, John Hoang, Jerzy Lobacz
Patented Case
View Patent ↗
Granted: Jan 27, 2004
Filed: May 25, 2001
Inventors
Donald P. Richmond, II
John Hoang
Jerzy Lobacz
Assignee (at issue)
AEHR TEST SYSTEMS
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.