Granted Patent
Utility
US 6,693,716 · App. 09/973,983
Method and apparatus for optical measurement of a surface profile of a specimen
Inventor:
Frank Sieckmann
Patented Case
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Granted: Feb 17, 2004
Filed: Oct 11, 2001
Inventor
Frank Sieckmann
Assignee (at issue)
Leica Microsystems Imaging Solutions
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.