IP Library › Granted Patent US 6,694,274
Granted Patent Utility
US 6,694,274 · App. 10/320,441

Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same

Inventor: Kazuhiro Sakaguchi
Patented Case View Patent ↗
Granted: Feb 17, 2004 Filed: Dec 17, 2002
Inventor
Kazuhiro Sakaguchi
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 6,694,274
App. No.
10/320,441
Filed
2002-12-17
Granted
2004-02-17
Kind
B2