Granted Patent
Utility
US 6,703,856 · App. 09/994,675
Test method of electro-optical device, test circuit of electro-optical device, electro-optical device, and electronic equipment
Inventor:
Shin Fujita
Patented Case
View Patent ↗
Granted: Mar 9, 2004
Filed: Nov 28, 2001
Inventor
Shin Fujita
Assignee (at issue)
SEIKO EPSON CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.