Granted Patent
Utility
US 6,710,608 · App. 10/076,508
Contact probe and probe device
Inventors:
Hideaki Yoshida, Toshinori Ishii, Atushi Matsuda, Mituyoshi Ueki, Noriyoshi Tachikawa, Tadashi Nakamura, Naoki Katou, Shou Tai, Hayato Sasaki, Naohumi Iwamoto, Akihumi Mishima, Toshiharu Hiji, Akihiro Masuda
Patented Case
View Patent ↗
Granted: Mar 23, 2004
Filed: Feb 19, 2002
Inventors
Hideaki Yoshida
Toshinori Ishii
Atushi Matsuda
Mituyoshi Ueki
Noriyoshi Tachikawa
Tadashi Nakamura
Naoki Katou
Shou Tai
Hayato Sasaki
Naohumi Iwamoto
Akihumi Mishima
Toshiharu Hiji
Akihiro Masuda
Assignee (at issue)
MITSUBISHI MATERIALS CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.