Granted Patent
Utility
US 6,751,144 · App. 10/148,430
Semiconductor storage and method for testing the same
Inventors:
Hiroyuki Takahashi, Hideo Inaba, Takashi Kusakari
Patented Case
View Patent ↗
Granted: Jun 15, 2004
Filed: May 29, 2002
Inventors
Hiroyuki Takahashi
Hideo Inaba
Takashi Kusakari
Assignee (at issue)
NEC Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.