Granted Patent
Utility
US 6,751,764 · App. 09/909,742
Method and apparatus for testing and debugging a circuit
Inventors:
Farideh Golshan, Sai V. Vishwanthaiah
Patented Case
View Patent ↗
Granted: Jun 15, 2004
Filed: Jul 19, 2001
Inventors
Farideh Golshan
Sai V. Vishwanthaiah
Assignee (at issue)
Sun Microsystems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.