IP Library › Granted Patent US 6,755,934
Granted Patent Utility
US 6,755,934 · App. 09/950,748

Processing apparatus having particle counter and cleaning device, cleaning method, cleanliness diagnosis method and semiconductor fabricating apparatus using the same

Inventor: Kenji Matsuoka
Patented Case View Patent ↗
Granted: Jun 29, 2004 Filed: Sep 12, 2001
Inventor
Kenji Matsuoka
Assignee (at issue)
NEC Electronics Corporation

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Quick Facts
Patent No.
US 6,755,934
App. No.
09/950,748
Filed
2001-09-12
Granted
2004-06-29
Kind
B2