IP Library › Granted Patent US 6,756,314
Granted Patent Utility
US 6,756,314 · App. 10/647,614

Method for etching a hard mask layer and a metal layer

Inventor: Ulrich Baier
Patented Case View Patent ↗
Granted: Jun 29, 2004 Filed: Aug 25, 2003
Inventor
Ulrich Baier
Assignee (at issue)
Infineon Technologies AG

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Quick Facts
Patent No.
US 6,756,314
App. No.
10/647,614
Filed
2003-08-25
Granted
2004-06-29
Kind
B2