Granted Patent
Utility
US 6,759,858 · App. 09/421,210
Integrated circuit test probe having ridge contact
Inventor:
Amir Roggel
Patented Case
View Patent ↗
Granted: Jul 6, 2004
Filed: Oct 20, 1999
Inventor
Amir Roggel
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.