Granted Patent
Utility
US 6,762,611 · App. 10/010,504
Test configuration and test method for testing a plurality of integrated circuits in parallel
Inventors:
Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller, Jürgen Weidenhöfer
Patented Case
View Patent ↗
Granted: Jul 13, 2004
Filed: Dec 5, 2001
Inventors
Michael Hübner
Gunnar Krause
Justus Kuhn
Jochen Müller
Peter Pöchmüller
Jürgen Weidenhöfer
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.