Granted Patent
Utility
US 6,792,373 · App. 10/154,627
Methods and apparatus for semiconductor testing
Inventor:
Eric Paul Tabor
Patented Case
View Patent ↗
Granted: Sep 14, 2004
Filed: May 24, 2002
Inventor
Eric Paul Tabor
Assignee (at issue)
Test Advantage, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.