IP Library Granted Patent US 6,815,966
Granted Patent Utility
US 6,815,966 · App. 10/184,525

System for burn-in testing of electronic devices

Inventors: Bradley R. Gunn, Alberto Calderon, Jovan Jovanovic, David S. Hendrickson
Patented Case View Patent ↗
Granted: Nov 9, 2004 Filed: Jun 27, 2002
Inventors
Bradley R. Gunn
Alberto Calderon
Jovan Jovanovic
David S. Hendrickson
Assignee (at issue)
AEHR TEST SYSTEMS

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Quick Facts
Patent No.
US 6,815,966
App. No.
10/184,525
Filed
2002-06-27
Granted
2004-11-09
Kind
B1