IP Library Granted Patent US 6,971,053
Granted Patent B1
US 6,971,053 · App. 10/208,226 · Granted Nov 29, 2005

Method for initiating internal parity operations in a CAM device

Assignee: Cypress Semiconductor Corp.
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Quick Facts
Patent No.
US 6,971,053
App. No.
10/208,226
Granted
Nov 29, 2005
Kind
B1
Abstract

A circuit and a method of operating the circuit is provided. The method generally comprises the steps of (A) receiving an explicit error checking instruction generated outside the circuit, (B) performing an error checking operation for at least one of a plurality of memory locations within the circuit, and (C) generating a result signal from the error checking operation.

Claims (29)

1. A method of operating a circuit, comprising the steps of:

(A) receiving an explicit error checking instruction generated outside said circuit;

(B) performing an error checking operation for at least one of a plurality of memory locations within said circuit;

(C) generating a result signal from said error checking operation; and

(D) completing said error checking operation within a predetermined number of clock cycles.

2. The method according to claim 1 , wherein said step (B) comprises the sub-step of performing said error checking operation on at least two of said memory locations for each said explicit error checking instruction received.

3. The method according to claim 2 , wherein said explicit error checking instruction indicates said at least two memory locations.

4. The method according to claim 1 , wherein said step (B) further comprises the sub-step of performing said error checking operation at a starting address generated outside said circuit.

5. The method according to claim 4 , wherein said explicit error checking instruction comprises said starting address.

6. The method according to claim 4 , further comprising the step of incrementing said starting address by a plurality of address units.

7. The method according to claim 1 , wherein said explicit error checking instruction indicates said predetermined number of clock cycles.

8. The method according to claim 1 , further comprising the step of performing said error checking operation in response to an idle instruction received while a configuration signal is in a first state.

9. The method according to claim 1 , further comprising the step of performing said error checking operation in response to not receiving a valid instruction for a predetermined amount of time while a configuration signal is in a first state.

10. The method according to claim 1 , further comprising the step of disabling said explicit error checking instruction in response to a configuration signal having a first state.

11. A circuit comprising:

a plurality of memory locations;

a checking circuit configured to (i) perform an error checking operation for at least one of said memory locations in response to receiving an explicit error checking instruction generated outside said circuit and (ii) generate a result signal from said error checking operation; and

a register coupled to said memory locations and configured to store an address generated outside said circuit.

12. The circuit according to claim 11 , further comprising a counter configured to increment said address by a plurality of address units.

13. The circuit according to claim 11 , further comprising a control circuit configured to detect said explicit error checking instruction from a stream of instructions.

14. The circuit according to claim 11 , wherein each of said memory locations comprises an error detection portion accessible to said error checking operation.

15. The circuit according to claim 11 , wherein said memory locations are configured as a first content addressable memory circuit.

16. The circuit according to claim 15 , further comprising a second content addressable memory circuit cascaded with said first content addressable memory circuit and responsive to said explicit error checking instruction received by said first content addressable memory circuit.

17. The circuit according to claim 11 , wherein said checking circuit is further configured to perform said error checking operation on all said memory locations in response to receiving a predetermined number of said explicit error checking instructions.

18. A method of operating a circuit, comprising the steps of:

(A) receiving an explicit error checking instruction generated outside said circuit;

(B) performing an error checking operation for at least one of a plurality of memory locations within said circuit;

(C) generating a result signal from said error checking operation; and

(D) disabling said explicit error checking instruction in response to a configuration signal having a first state.

Assignments (9)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: BROADCOM CORPORATION
Reel/Frame 041712/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2017
From: BROADCOM CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041706/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: BROADCOM CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037806/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2015
From: NETLOGIC I LLC
To: BROADCOM CORPORATION
Reel/Frame 035443/0763 →
CHANGE OF NAME Recorded Apr 16, 2015
From: NETLOGIC MICROSYSTEMS, INC.
To: NETLOGIC I LLC
Reel/Frame 035443/0824 →
RELEASE OF SECURITY INTEREST Recorded Aug 30, 2011
From: SILICON VALLEY BANK
To: NETLOGIC MICROSYSTEMS, INC.; NETLOGIC MICROSYSTEMS INTERNATIONAL LIMITED; NETLOGIC MICROSYSTEMS CAYMANS LIMITED
Reel/Frame 026830/0141 →
SECURITY AGREEMENT Recorded Jul 17, 2009
From: NETLOGIC MICROSYSTEMS, INC.; NETLOGIC MICROSYSTEMS INTERNATIONAL LIMITED; NETLOGIC MICROSYSTEMS CAYMANS LIMITED
To: SILICON VALLEY BANK
Reel/Frame 022973/0710 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2006
From: CYPRESS SEMICONDUCTOR CORPORATION
To: NETLOGIC MICROSYSTEMS, INC.
Reel/Frame 017379/0729 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2002
From: SMITH, SCOTT G.
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 013150/0862 →