High reflection microwave tuner using metal-dielectric probe and method
View Patent ↗Combination metal-dielectric microwave probes are sliding on the central conductor of an electro-mechanical microwave two-probe load pull tuner and create higher reflection factor over a wider frequency bandwidth than was previously possible using pure dielectric probes. The microwave probes are made of a combination of metal and dielectric materials in form of a square metallic slug body with a dielectric cylindrical core embedded inside. The cylindrical dielectric core also guides the probes and allows them to slide smoothly on the central conductor of the tuner airline without major alignment. The probes are positioned horizontally using a remote translation mechanism and allow continuous coverage of the Smith chart over a high frequency and VSWR (reflection factor) range. The mutual horizontal distance between the probes determines the amplitude of the reflection factor, whereas their common distance from the tuner test port determines its phase.
1. A calibration method for electromechanical tuner of a metal-dielectric combination microwave probes for use in two-probe electromechanical microwave load-pull tuners comprising: a test port and an idle port, wherein said probes are surrounding the central conductor and are sliding over the central conductor of the slotted airline of said tuner and their position is controlled independently by means of a horizontal remote translation mechanism; using a calibrated vector network analyzer (VNA) measuring scattering parameters (S parameters) between the test and idle port of the tuner as a function of the combination of two sets of horizontal positions of the probes related to the test port of the tuner; saving the scattering parameters in a calibration data file for later use; wherein a first set of positions is selected when both probes move simultaneously away from the test port between zero and one half of a wavelength at the center frequency of operation and a second set of positions is selected when the first probe remains immobile closest to the test port and the second probe moves away from zero to one half of a wavelength at the center frequency of operation, relative to the position of the first probe.