IP Library › Granted Patent US 7,106,772
Granted Patent B2
US 7,106,772 · App. 10/747,170 · Granted Sep 12, 2006

Distributed feedback semiconductor laser

Assignee: Fujitsu Limited
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Quick Facts
Patent No.
US 7,106,772
App. No.
10/747,170
Granted
Sep 12, 2006
Kind
B2
Abstract

A tuning layer is disposed spaced by some distance apart from an active layer in a thickness direction, the tuning layer having a transition wavelength shorter than a wavelength of light radiated from the active layer. A diffraction grating layer is disposed between the active layer and tuning layer, a refractive index of the diffraction grating layer being periodically changed along an optical resonator direction. A first electrode supplies the active layer with current. A second electrode supplies the tuning layer with current independently from the current to be supplied to the active layer. A TTG-DFB laser is provided which can maintain a proper coupling coefficient and has characteristics suitable for application to communication light sources.

Claims (21)

1. A semiconductor laser comprising:

an active layer for radiating light through stimulated emission by carrier injection;

a tuning layer disposed spaced by some distance apart from the active layer in a thickness direction, the tuning layer having a transition wavelength shorter than a wavelength of the light radiated from the active layer;

an intermediate layer formed on said tuning layer;

a diffraction grating layer disposed between the active layer and the intermediate layer, a refractive index of the diffraction grating layer being periodically changed along an optical resonator direction;

a first electrode for supplying the active layer with current; and

a second electrode for supplying the tuning layer with current independently from the current to be supplied to the active layer.

2. The semiconductor laser according to claim 1 , further comprising a pair of clad layers, between which the active layer, the diffraction grating layer and the tuning layer are interposed.

3. The semiconductor laser according to claim 1 , wherein the active layer has a multiple quantum well structure alternately stacking quantum well layers and barrier layers.

4. The semiconductor laser according to claim 2 , wherein the active layer has a multiple quantum well structure alternately stacking quantum well layers and barrier layers.

5. The semiconductor laser according to claim 1 , wherein the tuning layer has a multiple quantum well structure alternately stacking quantum well layers and barrier layers.

6. The semiconductor laser according to claim 2 , wherein the tuning layer has a multiple quantum well structure alternately stacking quantum well layers and barrier layers.

7. The semiconductor laser according to claim 1 , wherein the diffraction grating layer comprises:

a diffraction grating having a periodical structure along the optical resonator direction; and

a burying layer burying the diffraction grating and having a refractive index different from the refractive index of the diffraction grating.

8. The semiconductor laser according to claim 2 , wherein the diffraction grating layer comprises:

a diffraction grating having a periodical structure along the optical resonator direction; and

a burying layer burying the diffraction grating and having a refractive index different from the refractive index of the diffraction grating.

9. The semiconductor laser according to claim 7 , further comprising an intermediate layer disposed between the tuning layer and the diffraction grating layer, wherein the intermediate layer, the diffraction grating layer and the burying layer have a same conductivity type.

10. The semiconductor laser according to claim 8 , further comprising an intermediate layer disposed between the tuning layer and the diffraction grating layer, wherein the intermediate layer, the diffraction grating layer and the burying layer have a same conductivity type.

11. The semiconductor laser according to claim 1 , further comprising an intermediate layer disposed between the tuning layer and the diffraction grating layer, wherein the intermediate layer, the diffraction grating layer and the burying layer have a same conductivity type.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2003
From: SEKINE, NORIHIKO
To: FUJITSU LIMITED
Reel/Frame 014854/0573 →
Priority Claims (1)
JP 2003-028555 · Feb 5, 2003 · national
Continuity (1)
Related Publication 20040151222A1 · Aug 5, 2004