IP Library Granted Patent US 7,111,198
Granted Patent B2
US 7,111,198 · App. 10/459,450 · Granted Sep 19, 2006

Multithread auto test method

Assignee: Inventec Corporation
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Quick Facts
Patent No.
US 7,111,198
App. No.
10/459,450
Granted
Sep 19, 2006
Kind
B2
Abstract

A multithread auto test method is disclosed for the test process of computer hardware. According to the exclusion relation among the unique IDs of the test items, a multithread executable logic is automatically generated. An appropriate parallel method is employed to find procedures for test items that do not have conflictions. Therefore, multithreads of test procedures are performed to increase the test efficiency and quality. The method includes the steps of: determining a unique ID of a test item; automatically generating a test logic table according to the exclusion relation among the unique IDs; and performing multithread test procedure according to the test logic given in the test logic table.

Claims (22)

1. A multithread auto test method for testing computer hardware, comprising the steps of:

determining a unique ID for each test wherein the data format of the unique ID includes a “device name” and a “test name”;

automatically generating a test logic table according to exclusion relations among the unique IDs; and

executing a multithread test procedure according to the test logic given in the test logic table;

wherein the step of automatically generating a test logic table further includes the steps of:

obtaining the unique IDs of all tests to be performed and writing them into the test logic table;

analyzing the device name of each of the unique IDs and writing them into the test logic table;

comparing the device names of two tests;

putting the logic values created in the comparison step into the corresponding fields in the test logic table; and

determining whether all tests have been done and, if not, redoing the analysis and comparison.

2. The method of claim 1 , wherein the logic value is set as “no” if the device names of two tests are the same and as “yes” if the device names of two tests are different in the step of putting the logic values created in the comparison step into the corresponding fields in the test logic table.

3. The method of claim 1 , wherein the exclusion relations among the unique IDs are determined by whether the device names of the logic device names of the tests are the same, so that the exclusion relation holds if two device names are the same and does not hold if two device names are different.

4. The method of claim 1 , wherein a test queue and an executable queue are used in the step of executing a multithread test procedure according to the test logic given in the test logic table.

5. The method of claim 4 , wherein the step of executing a multithread test procedure comprises the steps of:

putting all the tests in the test queue and leaving the executable queue empty;

obtaining a test item from the test queue and putting it into the executable queue, and generating a corresponding test procedure;

scanning all of the tests in the test queue to find all of the tests that can be performed at the same time with the test item in the executable queue, and moving any such tests found, into the executable queue and generating the corresponding test procedures;

removing a test that is done and the corresponding test procedure from the executable queue; and

determining iteratively whether all the tests in the test queue are completed.

6. The method of claim 5 , wherein the scanning rule is determined by the test logic given in the test logic table.

7. The method of claim 4 , wherein the test queue has all of the tests to be performed.

8. The method of claim 4 , wherein the executable queue has the test items that are being performed at a particular moment.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2003
From: LIU, WIN-HARU; SONG, JEFF; SHI, YONG-JUEN
To: INVENTEC CORPORATION
Reel/Frame 014169/0725 →
Continuity (1)
Related Publication 20040268182A1 · Dec 30, 2004