IP Library › Granted Patent US 7,295,089
Granted Patent B2
US 7,295,089 · App. 10/773,818 · Granted Nov 13, 2007

Surface acoustic wave filter and communication apparatus

Assignee: Murata Manufacturing Co., Ltd.
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Quick Facts
Patent No.
US 7,295,089
App. No.
10/773,818
Granted
Nov 13, 2007
Kind
B2
Abstract

A surface acoustic wave (SAW) filter includes a piezoelectric substrate. A resin pattern having a permittivity less than that of the piezoelectric substrate and first and second conductor patterns are disposed on the piezoelectric substrate. The first conductor pattern defines two one-terminal-pair SAW resonators and two longitudinally coupled resonator SAW filters. A portion of the second conductor pattern defines wiring traces having different potentials. Portions of the wiring traces facing each other in a plan view are disposed on the resin pattern.

Claims (30)

1. A surface acoustic wave filter comprising:

a piezoelectric substrate;

an insulating pattern disposed on the piezoelectric substrate and having permittivity less than that of the piezoelectric substrate; and

a conductor pattern disposed on at least one of the piezoelectric substrate and the insulating pattern; wherein

a portion of the conductor pattern defines IDTs and another portion of the conductor pattern defines wiring traces; and

at a portion where wiring traces having different potentials face each other in a plan view, a ground wiring trace is disposed directly on the piezoelectric substrate; and

at least one of the wiring traces having a different potential from that of the ground wiring trace is disposed on the insulating pattern.

2. A surface acoustic wave filter according to claim 1 , wherein the conductor pattern includes a first conductor pattern disposed on the piezoelectric substrate, a portion thereof defining the IDTs, and a second conductor pattern which is in conduction with the first conductor pattern, a portion thereof being disposed on the insulating pattern.

3. A surface acoustic wave filter according to claim 1 , wherein the relative permittivity of the insulating pattern is less than about 4.

4. A surface acoustic wave filter according to claim 1 , wherein the relative permittivity of the piezoelectric substrate is about 20 or more.

5. A surface acoustic wave filter according to claim 4 , wherein the piezoelectric substrate includes at least one of LiTaO 3 , LiNbO 3 , and Li 2 B 4 O 7 .

6. A surface acoustic wave filter according to claim 1 , wherein the center frequency of a pass band is about 500 MHz or more.

7. A surface acoustic wave filter according to claim 1 , wherein the center frequency of a pass band is about 1 GHz or more.

8. A surface acoustic wave filter according to claim 1 , wherein the surface acoustic wave filter has a balance-to-unbalance transformer function and includes a balanced signal terminal and an unbalanced signal terminal.

9. A surface acoustic wave filter according to claim 8 , wherein at least one of a wiring trace connected to the balanced signal terminal and a wiring trace connected to the unbalanced signal terminal is disposed on the insulating pattern.

10. A communication apparatus comprising the surface acoustic wave filter according to claim 1 .

11. A surface acoustic wave filter comprising:

a piezoelectric substrate;

an insulating pattern disposed on the piezoelectric substrate and having permittivity less than that of the piezoelectric substrate; and

a conductor pattern disposed on at least one of the piezoelectric substrate and the insulating pattern; wherein

a portion of the conductor pattern defines IDTs and another portion of the conductor pattern defines wiring traces; and

at a portion where wiring traces having different potentials face each other in a plan view, at least a portion of at least one of the wiring traces is disposed on the insulating pattern; and

the insulating pattern includes resin.

12. A surface acoustic wave filter comprising:

a piezoelectric substrate;

an insulating pattern disposed on the piezoelectric substrate and having permittivity less than that of the piezoelectric substrate; and

a conductor pattern disposed on at least one of the piezoelectric substrate and the insulating pattern; wherein

a portion of the conductor pattern defines IDTs and another portion of the conductor pattern defines wiring traces; and

at a portion where wiring traces having different potentials face each other in a plan view, at least a portion of at least one of the wiring traces is disposed on the insulating pattern; and

the insulating pattern has a thickness of about 0.5 μm or more.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2004
From: SHIBAHARA, TERUHISA; NAKAHASHI, NORIHIKO; WATANABE, HIROKI; TAKAMINE, YUICHI
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 014735/0271 →
Priority Claims (2)
JP 2003-046269 · Feb 24, 2003 · national
JP 2003-406255 · Dec 4, 2003 · national
Continuity (1)
Related Publication 20040196119A1 · Oct 7, 2004