Display device and pixel testing method thereof
A display device has a display panel, which includes a plurality of IC pads, a plurality of data lines, a selector, a plurality of switches and a test pad. The IC pads are connected to the data lines through the selector. The data lines are electrically connected to a corresponding pixel circuit. The IC pads are connected to the test pad via the corresponding switch. The switches are sequentially turned on to sequentially transmit a voltage to the corresponding pixel circuit through the test pad.
1. A display device, comprising:
a plurality of first signal lines electrically connected to corresponding pixel circuits, respectively;
a plurality of second signal lines electrically connected to the corresponding pixel circuits, respectively;
a first main thin-film transistor set having a first main thin-film transistor and a second main thin-film transistor, each of which has a first terminal, a second terminal and a control terminal;
a second main thin-film transistor set having another first main thin-film transistor and another second main thin-film transistor, each of which has a first terminal, a second terminal and a control terminal, wherein the first terminals of the first main thin-film transistors are electrically connected to the first signal lines and the first terminals of the second main thin-film transistors are electrically connected to the second signal lines;
a test pad for receiving power signals for driving the pixel circuits and outputting voltage levels stored in the pixel circuits;
a first auxiliary thin film transistor having a first terminal, a second terminal and a control terminal, wherein the first terminal of the first auxiliary thin film transistor is electrically connected to the second terminals of the first main thin-film transistor set; and
a second auxiliary thin film transistor having a first terminal, a second terminal and a control terminal, wherein the first terminal of the second auxiliary thin film transistor is electrically connected to the second terminals of the second main thin-film transistor set, the second terminals of the first auxiliary thin film transistor and the second auxiliary thin film transistor are coupled to the test pad, and the control terminals of the first auxiliary thin film transistor and the second auxiliary thin film transistor are adapted to receive corresponding auxiliary control signals, respectively.
2. The display device according to claim 1 , wherein each of the control terminals of the first main thin-film transistors is configured to receive a main control signal, and each of the control terminals of the second main thin-film transistors is configured to receive another main control signal.
3. The display device according to claim 2 , wherein the first main thin-film transistors are turned on when the main control signal is enabled, and the second main thin-film transistors is turned on when the another main control signal is enabled.
4. The display device according to claim 2 , wherein the auxiliary control signals are sequentially enabled when the main control signal is enabled, such that the first auxiliary thin film transistor and the second auxiliary thin film transistor are sequentially turned on.
5. The display device according to claim 4 , wherein the auxiliary control signals are sequentially enabled when the another main control signal is enabled, such that the first auxiliary thin film transistor and the second auxiliary thin film transistor are sequentially turned on.
6. The display device according to claim 1 , further comprising a data driving integrated circuit, which is electrically connected to the second terminals of the first main thin-film transistor set and the second main thin-film transistor set, for driving the pixel circuits, wherein the first auxiliary thin film transistor and the second auxiliary thin film transistor are cut off when the data driving integrated circuit drives the pixel circuits.
7. The display device according to claim 1 , wherein the pixel circuits, the first signal lines, the second signal lines, the first main thin-film transistor set, the second main thin-film transistor set, the first auxiliary thin film transistor, the second auxiliary thin film transistor and the test pad are formed on a glass substrate.