IP Library Granted Patent US 7,361,521
Granted Patent B2
US 7,361,521 · App. 11/503,944 · Granted Apr 22, 2008

Method of manufacturing vertical GaN-based light emitting diode

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,361,521
App. No.
11/503,944
Granted
Apr 22, 2008
Kind
B2
Abstract

The present invention relates to a method of manufacturing a vertical GaN-based LED. The method includes forming an insulating pattern on a substrate to define LED regions having a predetermined size; sequentially stacking an n-type GaN-based semiconductor layer, an active layer, and a p-type GaN-based semiconductor layer on the substrate except for the insulating pattern to form a light emitting structure; removing the insulating pattern to divide the light emitting structure into LED sections having a predetermined size; forming p-electrodes on the LED sections, respectively; forming a structure support layer on the p-electrodes; removing the substrate to expose the divided n-type GaN-based semiconductor layer; and forming n-electrodes on the exposed n-type GaN-based semiconductor layer.

Claims (22)

1. A method of manufacturing a vertical GaN-based LED (light emitting diode) device, the method comprising:

forming an insulating pattern on a substrate to define LED regions having a predetermined size;

sequentially stacking an n-type GaN-based semiconductor layer, an active layer, and a p-type GaN-based semiconductor layer on the substrate except for the insulating pattern to form a light emitting structure;

removing the insulating pattern to divide the light emitting structure into LED sections having a predetermined size;

forming p-electrodes on the LED sections, respectively;

forming a structure support layer on the p-electrodes;

removing the substrate to expose the n-type GaN-based semiconductor layer; and

forming n-electrodes on the exposed n-type GaN-based semiconductor layer.

2. The method according to claim 1 ,

wherein the insulating pattern is formed of silicon oxide or nitride oxide.

3. The method according to claim 1 ,

wherein the removing of the insulating pattern is performed by wet etching.

4. The method according to claim 1 ,

wherein the insulating pattern is lower than the n-type GaN-based semiconductor layer.

5. The method according to claim 4 ,

wherein the insulating pattern has a height of about 200 nm to 1000 nm.

6. The method according to claim 1 ,

wherein the insulating pattern has a width equal to or smaller than a length and a width of the light emitting structure divided into the LED sections.

7. The method according to claim 1 ,

wherein the light emitting structure is formed by sequentially growing the n-type GaN-based semiconductor layer, the active layer, and the p-type GaN-based semiconductor layer in a MOCVD (metal organic chemical vapor deposition) reactor.

8. The method according to claim 1 ,

further comprising forming a conductive bonding layer on the p-type GaN-based electrodes prior to the forming of the structure support layer.

Assignments (2)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2010
From: SAMSUNG ELECTRO-MECHANICS CO., LTD.
To: SAMSUNG LED CO., LTD.
Reel/Frame 024375/0448 →