IP Library › Granted Patent US 7,399,960
Granted Patent B2
US 7,399,960 · App. 11/333,214 · Granted Jul 15, 2008

Time of flight mass spectrometer

Assignee: Shimadzu Corporation
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Quick Facts
Patent No.
US 7,399,960
App. No.
11/333,214
Granted
Jul 15, 2008
Kind
B2
Abstract

A time of flight mass spectrometer according to the present invention includes: a) an ion source at which an ion starts flying; b) an energizer for giving a predetermined amount of energy to the ion to let the ion start flying from the ion source; c) an ion guide for forming a time-focusing flight path on which the ion flies once or repeatedly; d) a detector for detecting the ion after flying the flight path; e) an analysis controller for giving different amounts of energy to ions of the same kind using the energizer, and for measuring the values of the flight time of the ions from the ion source to the detector for the amount of energy; and f) a mass calculator for calculating or estimating the mass to charge ratio of the ion based on the difference in the values of the flight time of the ions. Since the flight time of ions on the time-focusing flight path does not depend on their kinetic energy, the difference in the flight time of an ion having two different amounts of energy gives the estimation of the mass to charge ratio of the ion. Thus, a mass spectrometry of an ion for a wide range of mass to charge ratio can be made by simply performing two measurements on the same sample. This greatly reduces the time and labor of mass analysis, and a wide range of mass spectrum can be obtained on a scarce sample on which many-time measurements are impossible.

Claims (13)

1. A time of flight mass spectrometer comprising:

a) an ion source at which an ion starts flying;

b) an energizer for giving a predetermined amount of energy to the ion to let the ion start flying from the ion source;

c) an ion guide for forming a flight path on which the ion flies once or repeatedly in a time-focusing manner;

d) a detector for detecting the ion after flying the flight path repeatedly;

e) an analysis controller for giving two different amounts of energy to ions of a same kind using the energizer, and for measuring values of flight time of the ions from the ion source to the detector for the two amounts of energy respectively; and

f) a mass calculator for calculating or estimating the mass to charge ratio of the ion of the same kind based on the difference in the values of the flight time of the ions of the same kind given two different amounts of energy.

2. The time of flight mass spectrometer according to claim 1 , wherein the ion source is a three-dimensional quadrupole ion trap.

3. The time of flight mass spectrometer according to claim 1 , wherein the ion guide forms a flight path of a circular orbit.

4. The time of flight mass spectrometer according to claim 1 , wherein the ion guide forms a flight path of an “8” shaped loop orbit.

5. The time of flight mass spectrometer according to claim 1 , wherein the ion guide forms a flight path of a straight reciprocal path.

6. The time of flight mass spectrometer according to claim 1 , wherein the ion guide forms a flight path of a curved reciprocal path.

7. The time of flight mass spectrometer according to claim 1 , wherein the ion source is an electron impact (EI) ionizer, in which a repeller electrode provided in an ionizing chamber, a drawing electrode provided outside the ionizing chamber and a voltage generator for applying voltage between them constitute the energizer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2006
From: YAMAGUCHI, SHINICHI
To: SHIMADZU CORPORATION
Reel/Frame 017484/0015 →
Priority Claims (1)
JP 2005-012210 · Jan 20, 2005 · national
Continuity (1)
Related Publication 20080006768A1 · Jan 10, 2008