IP Library › Granted Patent US 7,419,698
Granted Patent B2
US 7,419,698 · App. 10/493,667 · Granted Sep 2, 2008

Precursors for chemical vapor deposition

Assignee: Sigma-Aldrich Co.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,419,698
App. No.
10/493,667
Granted
Sep 2, 2008
Kind
B2
Abstract

Ti, Zr Hf and La precursors for use in MOCVD techniques have a ligand of the general formula OCR 1 (R 2 )CH 2 X, wherein R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group and X is selected from OR and NR 2 , wherein R is an alkyl group or a substituted alkyl group.

Claims (27)

1. A precursor for use in a MOCVD process having the following general formula:

M(L) x [OCR 1 (R 2 )CH 2 X] 4-x

wherein M is a metal selected from Ti, Zr and Hf, L is a ligand, x is a number from 0 through 3 inclusive, R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group, and X is OR, wherein R is an alkyl group or a substituted alkyl group.

2. The precursor according to claim 1 , wherein the ligand L is an alkoxy group having from 1 to 4 carbon atoms.

3. precursor according to claim 2 , wherein the ligand L is selected from tertiary-butoxide and iso-propoxide.

4. The precursor according to claim 1 , wherein [OCR 1 (R 2 )CH 2 X] is 1-methoxy-2-methyl-2-propanolate.

5. The precursor according to claim 1 , wherein [OCR 1 (R 2 )CH 2 X] is selected from the group consisting of OCH(Me)CH 2 OMe, OCEt 2 CH 2 OMe, OCH(Bu t )CH 2 OEt, OC(Bu t ) 2 CH 2 OEt, OC(Pr i ) 2 CH 2 OEt, OC(Pr i ) 2 CH 2 OC 2 H 4 OMe and OC(Bu t )(CH 2 Opr i ) 2 .

6. The precursor according to claim 1 , wherein said precursor is Zr(OBu t ) 2 (mmp) 2 .

7. The precursor according to claim 1 , wherein said precursor is Zr(mmp) 4 .

8. The precursor according to claim 1 , wherein said precursor is Hf(OBu t ) 2 (mmp) 2 .

9. The precursor according to claim 1 , wherein said precursor is Hf(mmp) 4 .

10. A method of making a Ti-. Zr- or Hf-based precursor for use in a MOCVD process comprising reacting HOCR 1 (R 2 )CH 2 X with the corresponding metal alkoxide or metal alkylamide in appropriate molar proportions; wherein R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group and X is selected from OR and NR 2 wherein R is an alkyl group or a substituted alkyl group.

11. A precursor for use in a MOCVD process having the following general formula:

La[OCR 1 (R 2 )CH 2 X] 3

wherein R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group and X is selected from OR and NR 2 , wherein R is an alkyl group or a substituted alkyl group.

12. The precursor according to claim 11 , wherein [OCR 1 (R 2 )CH 2 X] is 1-methoxy-2-methyl-2-propanolate.

13. The precursor according to claim 12 , wherein [OCR 1 (R 2 )CH 2 X] is selected from the group consisting of OCH(Me)CH 2 OMe, OCEt 2 CH 2 OMe, OCH(Bu t )CH 2 OEt, OC(Bu t ) 2 CH 2 OEt, OC(Pr i ) 2 CH 2 OEt, OCH(Bu t )CH 2 NEt 2 , OC(Pr i ) 2 CH 2 OC 2 H 4 OMe and OC(Bu t )(CH 2 OPr i ) 2 .

14. A method of making a precursor as claimed in claim 11 comprising reacting HOCR 1 (R 2 )CH 2 X with La{N(SiMe 3 ) 2 } 3 in appropriate molar proportions.

15. A method of depositing single or mixed oxide layers or films by MOCVD, in which a precursor is contained in a metalorganic bubbler; or by liquid injection MOCVD, in which a precursor is dissolved in an appropriate inert organic solvent and then evaporated into the vapor phase using a heated evaporator, wherein at least one of the precursors is as defined in claim 1 .

16. A method of providing a ZrO 2 , ZrSO, HfO 2 , HfSO, TiO 2 , or TiSO film on a silicon substrate, the method comprising using metalorganic chemical vapor deposition to deposit the metal oxide, wherein the deposition utilizes a precursor material of the formula:

M(L) x [OCR 1 (R 2 )CH 2 X] 4-x

wherein M is a metal selected from Ti, Zr and Hf, L is a ligand, x is a number from 0 through 3 inclusive, R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group, and X is selected from OR and NR 2 , wherein R is an alkyl group or a substituted alkyl group.

17. A method according to claim 16 , wherein the ligand L is an alkoxy group having from 1 to 4 carbon atoms.

18. A method of providing a LaO 2 or LaSO film on a silicon substrate, the method comprising using metalorganic chemical vapor deposition to deposit the metal oxide, wherein the deposition utilizes a precursor material of the formula:

La[OCR 1 (R 2 )CH 2 X ] 3

wherein R 1 is H or an alkyl group, R 2 is an optionally substituted alkyl group and X is selected from OR and NR 2 , wherein R is an alkyl group or a substituted alkyl group.

19. The method according to claim 18 , wherein said precursor is La(mmp) 3 .

Assignments (4)
MERGER Recorded Jul 6, 2011
From: SIGMA-ALDRICH CO.
To: SIGMA-ALDRICH CO. NEWCO INC.
Reel/Frame 026551/0161 →
CHANGE OF NAME Recorded Jul 6, 2011
From: SIGMA-ALDRICH CO. NEWCO INC.
To: SIGMA-ALDRICH CO. LLC
Reel/Frame 026552/0245 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2008
From: EPICHEM LIMITED
To: SIGMA-ALDRICH CO.
Reel/Frame 020331/0162 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2004
From: JONES, ANTHONY COPELAND
To: EPICHEM LIMITED
Reel/Frame 015749/0797 →
Priority Claims (2)
GB 0125724.5 · Oct 26, 2001 · national
GB 0129080.8 · Dec 4, 2001 · national
Continuity (1)
Related Publication 20050008781A1 · Jan 13, 2005