Micromachined field asymmetric ion mobility filter and detection system
View Patent ↗A micromechanical field asymmetric ion mobility filter for a detection system includes a pair of spaced substrates defining between them a flow path between a sample inlet and an outlet; an ion filter disposed in the path and including a pair of spaced filter electrodes, one electrode associated with each substrate; and an electrical controller for applying a bias voltage and an asymmetric periodic voltage across the ion filter electrodes for controlling the paths of ions through the filter.
1. An ion mobility based system for analyzing a sample comprising:
an asymmetric electric field for dispersing ions of the sample,
a filter electrode in communication with a flow path, within which the asymmetric field is formed, and
a controller for automatically adjusting at least one condition of the asymmetric field to separate particular ones of the dispersed ions from others of the dispersed ions for analyzing a component in the sample.
2. The system of claim 1 , wherein the controller is configured to selectively adjust at least one condition of the flow path.
3. The system of claim 1 including a detector for providing spectral information, at least about the separated ions, for analyzing the component in the sample.
4. The system of claim 3 including a detector for measuring a quantity of the component in the sample.
5. The system of claim 1 , wherein the at least one condition includes a DC bias voltage applied to the filter electrode to bias the asymmetric field.
6. The system of claim 1 wherein the at least one condition includes an amount of time that the DC bias voltage is applied to the filter electrode to control an amount of charge collected on a detector in the flow path.
7. The system of claim 1 , wherein the at least one condition includes a duty cycle of the periodic voltage applied to the filter electrodes.
8. The system of claim 1 including a longitudinally extending spacer in the flow path for spacing apart the filter electrode from a second filter electrode.
9. The system of claim 1 including a spacer plate for spacing apart the filter electrode from a second filter electrode.
10. The system of claim 1 including an electrically conductive spacer for spacing apart the filter electrode from a second filter electrode.
11. The system of claim 1 including an electrically insulative spacer for spacing apart the filter electrode from a second filter electrode.
12. The system of claim 1 including an electrode for confining the ions to a substantially central portion of the flow path.
13. The system of claim 2 , wherein the at least one condition includes an amount of heating or ion flow rate in the ion flow path.
14. The system of claim 1 including a doping inlet.
15. The system of claim 1 , wherein the filter electrode is formed on a substrate by one of micromachining, etching, and dicing.
16. The system of claim 15 , wherein the substrate is substantially planar.
17. The system of claim 2 , wherein the at least one condition includes an amount of the dopant being introduced via a dopant inlet into the flow path.
18. The system of claim 2 , wherein the at least one condition includes an amount of purified air in the ion flow path.
19. The system of claim 2 , wherein the at least one condition includes an amount of one or more gases other than air in the ion flow path.
20. A method for analyzing a sample based on ion mobility, comprising:
dispersing ions of the sample using an asymmetric electric field in a flow path, and
automatically adjusting at least one condition of the asymmetric electric field to separate particular ones of the dispersed ions from others of the dispersed ions.
21. The method of claim 20 comprising selectively adjusting at least one condition of the flow path.
22. The method of claim 20 including detecting spectral information, at least about the separated ions, for analyzing a component in the sample.
23. The method of claim 20 wherein analyzing the component includes measuring the amount of the component in the sample.
24. The method of claim 20 , wherein the asymmetric field includes an RF field.
25. The method of claim 20 , wherein the at least one condition includes a duty cycle of a periodic voltage applied to a ion filter to control the asymmetric electric field.
26. The method of claim 20 , wherein the at least one condition includes a bias applied to the asymmetric field to separate particular ones of the dispersed ions from others of the dispersed ions.
27. The method of claim 21 wherein the at least one condition includes an amount of electrical current applied to an ion filter to control the amount of molecules that collect on the ion filter electrodes in the flow path.
28. The method of claim 21 , wherein the at least one condition includes a bias voltage level applied to a confining electrode to confine ions to a substantially central flow in the flow path.
29. The method of claim 21 , wherein the at least one condition includes an amount of heating or ion flow rate in the ion flow path.
30. The method of claim 21 , wherein the at least one condition includes an amount of purified air in the ion flow path.
31. The method of claim 21 , wherein the at least one condition includes an amount of a dopant in the flow path to change a spectrum associated with a component in the sample.
32. The method of claim 21 , wherein the at least one condition includes an amount of a gas other than air in the ion flow path.
33. The method of claim 21 , wherein the at least one condition includes an amount of a mixture of gases other than air into in the ion flow path.
34. The method of claim 21 , wherein the at least one condition includes a mixture of vapors in the ion flow path.
35. The system of claim 15 , wherein the controller includes a processor for automatically adjusting the at least one condition of the asymmetric field.
36. The method of claim 20 comprising forming a filter electrode on a substrate by one of micromachining, etching, and dicing and using the filter electrode to generate the asymmetric electric field.
37. The method of claim 36 comprising using a processor for automatically adjusting the at least one condition of the asymmetric field.