Device, system and method of thermal control
Briefly, some embodiments of the invention may provide devices, systems and methods for thermal control. For example, a method in accordance with an embodiment of the invention may include modifying an operational parameter of a processor based on a temperature of a heat sink associated with the processor.
1. A method comprising:
determining an operational parameter of a processor based on a temperature of a heat sink associated with the processor;
determining a power of said processor based on said temperature of the heat sink and based on a thermal resistance parameter; and
modifying the operational parameter of the processor based on the temperature of the heat sink.
2. The method of claim 1 , comprising sensing said temperature of said heat sink at one or more pre-defined locations.
3. The method of claim 1 , wherein said modifying comprises:
if said temperature is higher than a pre-defined threshold value, reducing an operational parameter selected from a group including a frequency of said processor, said power of said processor, a current of said processor, and a voltage of said processor.
4. The method of claim 1 , comprising sending a request to modify said operational parameter of said processor.
5. The method of claim 1 , comprising sending a request to reduce the frequency of said processor based on the power of said processor.
6. The method of claim 1 , comprising modifying an operational parameter of a processing unit based on the power of said processor.
7. An apparatus comprising:
a controller to determine an operational parameter of a processor based on a temperature of a heat sink associated with the processor and modify the operational parameter of the processor based on the temperature of the heat sink, wherein said controller is to determine a power of said processor based on said temperature of the heat sink and based on a thermal resistance parameter.
8. The apparatus of claim 7 , wherein said controller is, if said temperature is higher than a pre-defined threshold value, to reduce an operational parameter selected from a group including a frequency of said processor, said power of said processor, a current of said processor, and a voltage of said processor.
9. The apparatus of claim 7 , wherein said controller is to send a request to modify said operational parameter of said processor.
10. The apparatus of claim 7 , wherein said controller is to send a request to reduce the frequency of said processor based on the power of said processor.
11. The apparatus of claim 7 , wherein said controller is to modify an operational parameter of a processing unit based on the power of said processor.
12. The apparatus of claim 7 , wherein said controller comprises a thermal management unit.
13. A computing platform comprising:
a processor;
a heat sink associated with said processor; and
a controller to determine an operational parameter of the processor based on a temperature of the heat sink and modify said operational parameter of said processor based on the temperature of said heat sink, wherein said controller is to determine a power of said processor based on said temperature of the heat sink and based on a thermal resistance parameter.
14. The computing platform of claim 13 , comprising a thermal sensor associated with a pre-defined location of said heat sink to sense said temperature.
15. The computing platform of claim 14 , wherein said thermal sensor is integrally formed with said heat sink.
16. The computing platform of claim 14 , wherein said controller is able to read said sensed temperature from said thermal sensor.
17. A machine-readable medium having stored thereon a set of instructions that, if executed by a machine, cause the machine to perform a method comprising:
determining an operational parameter of a processor based on a temperature of a heat sink associated with the processor;
determining a power of said processor based on said temperature of the heat sink and based on a thermal resistance parameter; and
modifying the operational parameter of the processor based on the temperature of the heat sink.
18. The machine-readable medium of claim 17 , wherein the instructions result in:
sensing said temperature of said heat sink at one or more pre-defined locations.
19. The machine-readable medium of claim 17 , wherein the instructions result in:
if said temperature is higher than a pre-defined threshold value, reducing an operational parameter selected from a group including a frequency of said processor, a power of said processor, a current of said processor, and a voltage of said processor.