IP Library › Granted Patent US 7,554,091
Granted Patent B2
US 7,554,091 · App. 12/023,960 · Granted Jun 30, 2009

Feedback circuit for output control in a semiconductor X-ray detector

Assignee: Thermo Electron Scientific Instruments LLC
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Quick Facts
Patent No.
US 7,554,091
App. No.
12/023,960
Granted
Jun 30, 2009
Kind
B2
Abstract

An X-ray detector using a semiconductor detector, most preferably a Silicon Drift Detector, utilizes a field effect transistor or other voltage-controlled resistance to generate an output voltage proportional to its input charge (which is generated by the X-ray photons incident on the semiconductor detector). To keep the charge (and thus the output voltage) to an acceptable range—one wherein the relationship between output voltage and input charge is substantially proportional—a feedback circuit is provided between the output and input terminals, wherein the charge on the input terminal is depleted when the output voltage begins leaving the desired range. Preferably, this is done by a comparator which monitors the output voltage, and provides a reset signal to the input terminal when it begins moving out of range. Alternatively or additionally, the reset signal may be a pulse supplied to the input terminal from a pulse generator activated by the comparator.

Claims (45)

1. An x-ray detector including:

a) a semiconductor detector;

b) a voltage-controlled resistance having:

(1) a voltage supply,

(2) an input terminal in communication with the semiconductor detector, and

(3) an output terminal,

wherein the output terminal is biased by the voltage supply to have a voltage dependent on the voltage at the input terminal;

c) a feedback circuit between the output terminal and the input terminal, wherein the feedback circuit includes a comparator configured to supply a reset voltage signal to the input terminal if the voltage of the output terminal attains a threshold magnitude, and wherein the comparator is further configured to continue to supply the reset voltage signal to the input terminal until the voltage of the output terminal attains a turn-off magnitude, the turn-off magnitude being less than the threshold magnitude.

2. The x-ray detector of claim 1 wherein the semiconductor detector is a silicon drift detector (SDD).

3. The x-ray detector of claim 1 wherein the voltage-controlled resistance includes a field effect transistor having:

a) a drain in communication with the voltage supply;

b) a gate in connection with the input terminal, and

c) a source in connection with the output terminal.

4. The x-ray detector of claim 1 wherein the feedback circuit allows current flow from the output terminal to the input terminal, but not from the input terminal to the output terminal.

5. The x-ray detector of claim 1 wherein the feedback circuit includes a diode having a cathode in communication with the input terminal.

6. The x-ray detector of claim 1 wherein the feedback circuit further includes a pulse generator, wherein the pulse generator is configured to be activated by the comparator so as to send one or more reset voltage signal pulses to the input terminal if the voltage of the output terminal attains the threshold magnitude.

7. The x-ray detector of claim 6 further including a capacitor interposed between the pulse generator and the input terminal.

8. The x-ray detector of claim 6 wherein the comparator comprises a reset comparator.

9. The x-ray detector of claim 8 wherein the reset comparator is configured to continually trigger the pulse generator so as to supply the one or more reset voltage signal pulses to the input terminal until the voltage of the output terminal attains a turn-off magnitude, the turn-off magnitude being less than the threshold magnitude.

10. The x-ray detector of claim 8 further including a protection comparator interposed between the output terminal and the input terminal, and in parallel with the pulse generator and the reset comparator, wherein the protection comparator is configured to supply a sustained reset voltage signal to the input terminal if the voltage of the output terminal attains a threshold magnitude.

11. The x-ray detector of claim 1 wherein the feedback circuit includes:

a second comparator interposed between the output terminal and the input terminal, and in parallel with the comparator additionally configured to supply at least a portion of the reset voltage signal to the input terminal if the voltage of the output terminal attains a first threshold magnitude, and wherein the second comparator is configured to supply at least a portion of the reset voltage signal to the input terminal if the voltage of the output terminal attains a second threshold magnitude.

12. An x-ray detector including:

a) a semiconductor detector;

b) a FET having:

(1) a gate in communication with the semiconductor detector;

(2) a drain maintained at an at least substantially constant drain voltage; and

(3) a source,

c) a feedback circuit between the source and the gate, wherein the feedback circuit includes a comparator configured to supply a voltage signal to the gate if the source voltage attains a threshold magnitude, and wherein the comparator is further configured to supply the voltage signal to the gate until the source voltage drops below a turn-off magnitude which is less than the threshold magnitude.

13. The x-ray detector of claim 12 further including a pulse generator, wherein the comparator is configured to activate the pulse generator so as to supply the voltage signal to the gate if the source voltage attains the threshold magnitude.

14. The x-ray detector of claim 12 wherein the feedback circuit includes a capacitor between the comparator and the gate.

15. The x-ray detector of claim 14 further including a second comparator in parallel with the capacitor, wherein the second comparator is configured to supply a protect voltage signal to the gate if the source voltage attains a second threshold magnitude.

16. The x-ray detector of claim 15 further including a pulse generator in series with the capacitor and in parallel with the second comparator.

17. An x-ray detector including:

a) a semiconductor detector;

b) a PET having:

(1) a gate in communication with the semiconductor detector;

(2) a drain maintained at an at least substantially constant drain voltage; and

(3) a source,

c) a feedback circuit between the source and the gate, wherein the feedback circuit includes:

(1) a comparator receiving:

(a) an at least substantially constant threshold voltage, and

(b) a voltage proportional to the voltage of the source,

the comparator configured to provide an output signal when the proportional voltage is greater than the threshold voltage; and

(2) a pulse generator in communication with the comparator, wherein the pulse generator is configured to output one or more reset voltage signal pulses upon receiving the comparator output signal.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2008
From: DRUMMOND, WILLIAM E.; FAHRBACH, DAVID R.; HOWARD, JAMES V.; HYATT, JAMES R.; KIM, KEVIN K.; MISENHEIMER, MARK E.; STOCKER, DEAN A.
To: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Reel/Frame 021418/0872 →
MERGER Recorded Apr 2, 2008
From: NITON CORPORATION
To: NITON LLC
Reel/Frame 020745/0931 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2008
From: DRUMMOND, WILLIAM E.; FAHRBACH, DAVID R.; HOWARD, JAMES V.; HYATT, JAMES R.; KIM, KEVIN K.; MISENHEIMER, MARK E.; STOCKER, DEAN A.
To: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Reel/Frame 020730/0434 →
Continuity (2)
Continuation In Part 1149586700 · Jul 28, 2006
Related Publication 20080116384A1 · May 22, 2008