IP Library Granted Patent US 7,569,924
Granted Patent B2
US 7,569,924 · App. 11/459,543 · Granted Aug 4, 2009

Semiconductor device and manufacturing method thereof

Assignee: Shinko Electric Industries Co., Ltd.
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Quick Facts
Patent No.
US 7,569,924
App. No.
11/459,543
Granted
Aug 4, 2009
Kind
B2
Abstract

A semiconductor chip 11 comprising an element formation layer which is formed on a first main surface 35 A of a semiconductor substrate 35 and has a semiconductor element, through electrodes 15, 16 which are electrically connected to the semiconductor element and extend through the semiconductor chip 11 , and a patch antenna 33 formed on the side of a second main surface 35 B of the semiconductor substrate 35 are disposed, and the patch antenna 33 is electrically connected to the through electrode 15 electrically connected to a line for power feeding of the semiconductor element.

Claims (15)

1. A semiconductor device comprising:

a semiconductor chip comprising a semiconductor substrate and an element formation layer which is formed on a first main surface of said semiconductor substrate and has a semiconductor element; and

a passive circuit electrically connected to the semiconductor element,

wherein the passive circuit is disposed on the side of a second main surface opposite to the first main surface of the semiconductor substrate and the passive circuit is electrically connected to the semiconductor element by a through electrode passing through the semiconductor chip, and

wherein the passive circuit is a patch antenna or an inverted F-type antenna.

2. The semiconductor device as claimed in claim 1 , further comprising:

a ground layer disposed on the second main surface of the semiconductor substrate; and

a first insulating layer for covering said ground layer,

wherein the through electrode has a first through electrode electrically connected to the ground layer and a second through electrode electrically connected to a power feeding line of the semiconductor element.

3. The semiconductor device as claimed in claim 1 , wherein the passive circuit is electrically connected to the second through electrode when the passive circuit is a patch antenna.

4. The semiconductor device as claimed in claim 1 , wherein the passive circuit is electrically connected to the first and second through electrodes when the passive circuit is an inverted F-type antenna.

5. The semiconductor device as in claim 1 , further comprising:

a second insulating layer disposed on the element formation layer; and

an external connection terminal disposed on said second insulating layer,

wherein a wiring pattern for making electrical connection between the external connection terminal and the first and second through electrodes is disposed in the second insulating layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2006
From: FUJII, TOMOHARU
To: SHINKO ELECTRIC INDUSTRIES CO., LTD.
Reel/Frame 017989/0153 →
Priority Claims (1)
JP 2005-215871 · Jul 26, 2005 · national
Continuity (1)
Related Publication 20070023888A1 · Feb 1, 2007