IP Library › Granted Patent US 7,577,012
Granted Patent B2
US 7,577,012 · App. 11/782,174 · Granted Aug 18, 2009

Ferroelectric memory device, method for driving ferroelectric memory device, electronic apparatus, and method for driving electronic apparatus

Assignee: Seiko Epson Corporation
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Quick Facts
Patent No.
US 7,577,012
App. No.
11/782,174
Granted
Aug 18, 2009
Kind
B2
Abstract

A ferroelectric memory device includes: an odd number of memory regions, the odd number being at least three or higher; a readout circuit that reads data of 0 or 1 stored in the odd number of memory regions; a comparison circuit that compares readout data at corresponding addresses of the odd number of memory regions, and decides comparison data of 0 or 1 according to voting; and a write circuit that writes the comparison data in one region in the odd number of memory regions.

Claims (14)

1. A ferroelectric memory device comprising:

an odd number of memory regions, the odd number being at least three or higher;

a read-out circuit that reads data of 0 or 1 stored in the odd number of memory regions;

a comparison circuit that compares readout data at corresponding addresses of the odd number of memory regions, and decides comparison data of 0 or 1 according to voting;

a write circuit that writes the comparison data in one region in the odd number of memory regions; and

a judgment circuit that judges as to whether or not the number of power-on events is one.

2. A ferroelectric memory device according to claim 1 , wherein the comparison data is written in the one region, only when the number of power-on is one.

3. A ferroelectric memory device according to claim 1 , wherein the odd number of memory regions store identical programs.

4. A ferroelectric memory device according to claim 1 , wherein the memory regions other than the one region are used as rewritable regions.

5. A method for driving a ferroelectric memory device, the method comprising the steps of:

(1) storing a first program composed of 0 or 1 in an odd number of memory regions, the odd number being at least three or higher; and

(2) reading data at corresponding addresses of the odd number of memory regions, comparing the data readout, deciding comparison data of 0 or 1 according to voting, and writing the comparison data to one region in the odd number of memory regions, wherein a thermal load is applied between the steps (1) and (2).

6. A method for driving a ferroelectric memory device according to claim 5 , comprising the step of writing desired data in the memory regions other than the one region.

7. A method for driving an electronic apparatus comprising the method for driving a ferroelectric memory device recited in claim 5 .

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR MEMORY SOLUTION LIMITED
Reel/Frame 053195/0249 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 15, 2016
From: SEIKO EPSON CORPORATION
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 037987/0149 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2007
From: MURAKAMI, YASUHIKO
To: SEIKO EPSON CORPORATION
Reel/Frame 019603/0226 →
Priority Claims (1)
JP 2006-201931 · Jul 25, 2006 · national
Continuity (1)
Related Publication 20080025064A1 · Jan 31, 2008