IP Library › Granted Patent US 7,582,941
Granted Patent B2
US 7,582,941 · App. 11/480,242 · Granted Sep 1, 2009

Magnetic memory device and method of fabricating the same

Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 7,582,941
App. No.
11/480,242
Granted
Sep 1, 2009
Kind
B2
Abstract

A magnetic memory device includes a common line; a first write-in diode, a readout diode and a second write-in diode being connected to the common line in parallel. The magnetic memory device further includes a magnetic tunnel junction structure connected to the readout diode, first and second write-in conductors disposed at both sides of the magnetic tunnel junction structure and connected to the first and second write-in diodes, respectively and a first write-in line, a readout line and a second write-in line, which are connected to the first write-in conductor, the magnetic tunnel injection structure, and the second write-in conductor, respectively.

Claims (16)

1. A magnetic memory device comprising:

a common line;

a first write-in diode, a readout diode and second write-in diode being connected to the common line in parallel;

a magnetic tunnel junction structure connected to the readout diode;

first and second write-in conductors disposed at both sides of the magnetic tunnel junction structure and connected to the first and second write-in diodes, respectively; and

a first write-in line, a readout line and a second write-in line, which are connected to the first write-in conductor, the magnetic tunnel injection structure, and the second write-in conductor, respectively, wherein the first write-in diode, the readout diode, the second write-in diode, the magnetic tunnel junction structure, the first and second write-in conductors, the first write-in line, the readout line, and the second write-in line constitute a unit memory cell.

2. The magnetic memory device of claim 1 , wherein the first write-in conductor is adapted to apply a first electric field of a first direction to the magnetic tunnel junction structure during a first programming mode while the second write-in conductor is adapted to apply a second electric field of a second direction to the magnetic tunnel junction structure during a second programming mode, the first direction being reverse to the second direction.

3. The magnetic memory device of claim 2 , wherein the magnetic tunnel junction structure comprises:

a first magnetic layer having a fixed magnetization direction;

a second magnetic layer having a changeable magnetization direction; and

a tunnel barrier layer interposed between the first and second magnetic layers.

4. The magnetic memory device of claim 1 , wherein forward output terminals of the first write-in diode, the readout diode and the second write-in diode are connected to the common line,

wherein forward input terminals of the first write-in diode, the readout diode and the second write-in diode are each connected to the first write-in conductor, the magnetic tunnel junction structure and the second write-in conductor.

5. The magnetic memory device of claim 1 , wherein forward input terminals of the first write-in diode, the readout diode and the second write-in diode are connected to the common line,

wherein forward output terminals of the first write-in diode, the readout diode and the second write-in diode are each connected to the first write-in conductor, the magnetic tunnel junction structure and the second write-in conductor.

6. The magnetic memory device of claim 1 , wherein one of the common line and the readout line is correspondent with a word line, while the other of the common line and the readout line is correspondent with a bit line.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2006
From: CHO, WOO-YEONG; SHIN, YUN-SEUNG; BYUN, HYUN-GEUN; KWK, CHOONG-KEUN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 018080/0743 →
Priority Claims (1)
KR 10-2005-0078365 · Aug 25, 2005 · national
Continuity (1)
Related Publication 20070047295A1 · Mar 1, 2007