Circuit and method for initializing an internal logic unit in a semiconductor memory device

1. A semiconductor memory device, comprising:

a power-up signal generating unit for generating a power-up signal;

an internal reset signal generating unit for generating an internal reset signal based on a pad signal inputted from an arbitrary external pin during a test mode;

an internal logic initializing signal generating unit for generating an internal logic initializing signal based on the power-up signal and the internal reset signal; and

an internal logic unit initialized in response to the internal logic initializing signal;

wherein the semiconductor memory device excludes a dedicated external reset pin,

the internal logic initializing signal generating unit outputs the internal logic initializing signal activated when any one of the power-up signal and the internal reset signal is activated, and

the internal logic initializing signal generating unit includes,

a first transfer gate for transferring the power-lip signal in response to an inverted test mode signal,

a second transfer gate for transferring the internal reset signal in response to the test mode signal,

a latch unit for latching a signal at a common output node of the first and second transfer gates, and

an inverter for inverting an output of the latch unit to output the internal logic initializing signal.

2. The semiconductor memory device as recited in claim 1 , wherein the arbitrary external pin is not a reset dedicated pin.

3. The semiconductor memory device as recited in claim 1 , wherein the power-up signal is activated when a voltage level of a source voltage inputted from an external source is higher than a predetermined voltage level.

4. The semiconductor memory device as recited in claim 1 , further comprising an internal supply voltage generating unit for generating a plurality of internal supply voltages from a source voltage in response to the power-up signal.

5. A semiconductor memory device, comprising:

a power-up signal generating unit for generating a power-up signal;

a test mode determining unit for generating a test mode signal which is activated during a test mode;

a logical combination unit for generating an internal reset signal by logically combining a pad signal inputted from an arbitrary external pin and the test mode signal;

an internal logic initializing signal generating unit for generating an internal logic initializing signal based on the power-up signal and the internal reset signal; and

an internal logic unit initialized in response to the internal logic initializing signal;

wherein the semiconductor memory device excludes a dedicated external reset pin,

the internal logic initializing signal generating unit outputs the internal logic initializing signal activated when any one of the power-up signal and the internal reset signal is activated, and

the internal logic initializing signal generating unit includes,

a first transfer gate for transferring the power-up signal in response to an inverted test mode signal,

a second transfer gate for transferring the internal reset signal in response to the test mode signal,

a latch unit for latching a signal at a common output node of the first and second transfer gates, and

an inverter for inverting an output of the latch unit to output the internal logic initializing signal.

6. The semiconductor memory device as recited in claim 5 , wherein the arbitrary external pin is not a reset dedicated pin.

7. The semiconductor memory device as recited in claim 5 , wherein the power-up signal is activated when a voltage level of a source voltage inputted from an external source is higher than a predetermined voltage level.

8. The semiconductor memory device as recited in claim 5 , further comprising an internal supply voltage generating unit for generating a plurality of internal supply voltages from a source voltage in response to the power-up signal.

9. The semiconductor memory device as recited in claim 5 , wherein the logical combination unit outputs the pad signal as the internal reset signal during the test mode.

10. The semiconductor memory device as recited in claim 9 , wherein the logical combination unit includes:

a logic gate for performing a NAND operation of the pad signal and the test mode signal; and

an inverter for inverting an output of the logic gate to output the internal reset signal.

11. A method for initializing a semiconductor memory device, comprising:

generating a power-up signal activated when a voltage level of a source voltage inputted from an external source is higher than a predetermined voltage level;

generating an internal reset signal in response to a pad signal inputted from an arbitrary external pin;

generating an internal logic initializing signal based on the power-up signal and the internal reset signal; and

initializing internal circuits of the semiconductor memory device with the internal logic initializing signal;

wherein the semiconductor memory device excludes a dedicated external reset pin,

activating the internal logic initializing signal when any one of the power-up signal and the internal reset signal is activated, and

the step of generatine the internal logic initializing signal includes,

in a first transfer gate, transferring the power-up signal in response to an inverted test mode signal,

in a second transfer gate, transferring the internal reset signal in response to the test mode signal,

in a latch unit, latching a signal at a common output node of the first and second transfer gates, and

in an inverter, inverting an output of the latch unit to output the internal logic initializing signal.

12. The method as recited in claim 11 , wherein the generating step of the internal reset signal includes:

generating a test mode signal activated during a test mode; and

logically combining the pad signal and the test mode signal to generate the internal reset signal.

13. The method as recited in claim 12 , wherein the pad signal is outputted as the internal reset signal when the test mode signal is activated.