IP Library Granted Patent US 7,601,984
Granted Patent B2
US 7,601,984 · App. 11/269,600 · Granted Oct 13, 2009

Field effect transistor with amorphous oxide active layer containing microcrystals and gate electrode opposed to active layer through gate insulator

Assignees: Canon Kabushiki Kaisha; Tokyo Institute of Technology
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Quick Facts
Patent No.
US 7,601,984
App. No.
11/269,600
Granted
Oct 13, 2009
Kind
B2
Abstract

A novel amorphous oxide applicable, for example, to an active layer of a TFT is provided. The amorphous oxide comprises microcrystals.

Claims (6)

1. A field effect transistor comprising an active layer of an amorphous oxide containing a microcrystal, wherein a grain boundary interface of the microcrystal is surrounded by the amorphous oxide and a gate electrode formed so as to face the active layer through a gate insulator.

2. The field effect transistor according to claim 1 , wherein the transistor is a normally-off type transistor.

3. The field effect transistor according to claim 1 , which provides a current of 10 microamperes or less between a source and a drain when no gate voltage is applied.

4. The field effect transistor according to claim 1 , wherein the amorphous oxide containing the microcrystal controls entrapment of mobile electrons.

5. The field effect transistor according to claim 1 , wherein the amorphous oxide containing the microcrystal decreases the number of conductive electrons.

6. The field effect transistor according to claim 1 , wherein the amorphous oxide comprised in the active layer has an electron carrier density of less than 10 18 /cm 3 and has a tendency to increase electron mobility as electron carrier density increases.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2013
From: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY
To: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY; JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 030776/0506 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2006
From: SANO, MASAFUMI; NAKAGAWA, KATSUMI; HOSONO, HIDEO; KAMIYA, TOSHIO; NOMURA, KENJI
To: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY
Reel/Frame 017522/0195 →
Priority Claims (1)
JP 2004-326687 · Nov 10, 2004 · national
Continuity (1)
Related Publication 20060108636A1 · May 25, 2006