Three-dimensional shape-measuring device
View Patent ↗A 3-D shape measurement apparatus for grasping the state of an object with ease and accuracy is provided. The 3-D shape measurement apparatus includes: a first 3-D sensor 10 a having a projecting device 11 for projecting a light pattern on a target area, and a (first) image capturing apparatus 12 a placed at a first interval d 1 from the projecting device 11 to capture an image of the target area on which the light pattern is projected; a second 3-D sensor 10 b having a projecting device 11 , and a (second) image capturing apparatus 12 b placed at a second interval d 2 longer than the first interval d 1 from the projecting device 11 to capture an image of the target area on which the light pattern is projected; 3-D information computing means 22 for obtaining external shape information on an object 2 based on the shift of the pattern on the image acquired with the first 3-D sensor 10 a ; variation information computing means 23 for obtaining variation information on the object 2 based on the shift of the pattern on the image acquired with the second 3-D sensor 10 b ; and information composing means 24 for composing the external shape information and the variation information.
1. A three-dimensional shape measurement apparatus comprising:
a first three-dimensional sensor having a projecting device for projecting a light pattern on a target area, and an image capturing apparatus placed at a first interval from the projecting device to capture an image of the target area on which the light pattern is projected;
a second three-dimensional sensor having a projecting device for projecting a light pattern on the target area, and an image capturing apparatus placed at a second interval longer than the first interval from the projecting device to capture an image of the target area on which the light pattern is projected;
three-dimensional information computing means for obtaining external shape information on an object present in the target area based on a first shift of the pattern on an image acquired with the first three-dimensional sensor,
wherein said first shift of the pattern is a shift from a base image captured at a time point at which the object is not present in the target area to a captured image captured at an arbitrary time point at which the object is present in the target area;
variation information computing means for obtaining variation information on the object based on a second shift of the pattern on the image acquired with the second three-dimensional sensor,
wherein said second shift of the pattern is a shift from a reference image captured at a first arbitrary time point at which the object is present in the target area to a captured image captured at a second arbitrary time point after the first arbitrary time point with enough time interval for detecting a movement of the object and at which the object is present in the target area; and
information composing means for composing the external shape information and the variation information.
2. The three-dimensional shape measurement apparatus as recited in claim 1 , wherein the information composing means corrects the variation information based on the external shape information.
3. The three-dimensional shape measurement apparatus as recited in claim 1 , wherein the information composing means performs the composition so as to find out the movement of each point of the object.
4. The three-dimensional shape measurement apparatus as recited in claim 2 , wherein the information composing means performs the composition so as to find out the movement of each point of the object.
5. The three-dimensional shape measurement apparatus as recited in claim 1 , further comprising information output means for displaying the composed results of the information composing means.
6. The three-dimensional shape measurement apparatus as recited in claim 2 , further comprising information output means for displaying the composed results of the information composing means.
7. The three-dimensional shape measurement apparatus as recited in claim 3 , further comprising information output means for displaying the composed results of the information composing means.
8. The three-dimensional shape measurement apparatus as recited in claim 1 , wherein the light pattern is an array of bright spots.
9. The three-dimensional shape measurement apparatus as recited in claim 2 , wherein the light pattern is an array of bright spots.
10. The three-dimensional shape measurement apparatus as recited in claim 3 , wherein the light pattern is an array of bright spots.
11. The three-dimensional shape measurement apparatus as recited in claim 1 , wherein the three-dimensional information computing means performs interpolation for points that lack the external shape information.
12. The three-dimensional shape measurement apparatus as recited in claim 2 , wherein the three-dimensional information computing means performs interpolation for points that lack the external shape information.
13. The three-dimensional shape measurement apparatus as recited in claim 3 , wherein the three-dimensional information computing means performs interpolation for points that lack the external shape information.