IP Library Granted Patent US 7,652,962
Granted Patent B2
US 7,652,962 · App. 11/305,764 · Granted Jan 26, 2010

Using PRML read channel ADC for blank/defect and ripple detection

Assignee: LSI Corporation
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Quick Facts
Patent No.
US 7,652,962
App. No.
11/305,764
Granted
Jan 26, 2010
Kind
B2
Abstract

An apparatus including a photo detector circuit, a first circuit, a second circuit and a third circuit. The photo detector circuit may be configured to generate an RF signal in response to a laser spot on a surface of an optical disc. The first circuit may be configured to generate a first digital signal in response to an AC-coupled version of the RF signal. The second circuit may be configured to generate a second digital signal in response to a DC-coupled version of the RF signal. The third circuit may be configured to generate one or more detect signals in response to the first digital signal and the second digital signal. Each of the one or more detect signals may indicate a respective condition of the surface of the optical disc.

Claims (51)

1. An apparatus comprising:

a photo detector circuit configured to generate a radio frequency (RF) signal in response to a laser spot on a surface of an optical disc;

a first circuit configured to generate a first digital signal in response to an AC-coupled version of said RF signal;

a second circuit configured to generate a second digital signal in response to a DC-coupled version of said RF signal; and

a third circuit configured to generate one or more detect signals in response to said first digital signal and said second digital signal, wherein each of said one or more detect signals indicates a respective condition of said surface of said optical disc and said third circuit comprises (i) a detector circuit configured to determine a short term top value and a short term bottom value of said first digital signal during a predetermined period and (ii) a programmable window generator circuit configured to control said predetermined period.

2. The apparatus according to claim 1 , wherein said one or more detect signals indicate one or more conditions selected from the group consisting of blank, defect, land, mark and groove.

3. The apparatus according to claim 1 , wherein said first circuit comprises a RF analog-to-digital converter (ADC)

4. The apparatus according to claim 3 , wherein said RF ADC comprises a fast pipeline/flash ADC.

5. The apparatus according to claim 3 , wherein said ADC is part of a partial response maximum likelihood (PRML) read channel.

6. The apparatus according to claim 1 , wherein said second circuit comprises:

a low pass filter configured to receive said DC-coupled version of said RF signal; and

an analog-to-digital convertor (ADC) coupled to said low pass filter and configured to generate said second digital signal.

7. The apparatus according to claim 6 , wherein said ADC is part of a servo circuit.

8. The apparatus according to claim 1 , wherein said third circuit further comprises:

a programmable low pass filter configured to determine a long term top value and a long term bottom value of said first digital signal in response to a plurality of short term top values and a plurality of short term bottom values; and

a threshold circuit configured to generate a first threshold and a second threshold in response to said long term top value and said long term bottom value of said first digital signal and one or more programmable threshold ratios.

9. The apparatus according to claim 8 , wherein said programmable low pass filter comprises a filter selected from the group consisting of an infinite impulse response (IIR) filter and a finite impulse response (FIR) filter.

10. The apparatus according to claim 8 , wherein said programmable low pass filter comprises a first order Butterworth filter.

11. The apparatus according to claim 1 , wherein said third circuit further comprises:

a first comparator circuit configured to generate one of said one or more detect signals and a first intermediate signal in response to said short term top value, said short term bottom value, a first threshold and a second threshold;

a second comparator circuit configured to generate a second intermediate signal in response to said second digital signal and a third threshold; and

a logic circuit configured to generate at least one other of said one or more detect signals in response to said first and said second intermediate signals, wherein said first threshold, said second threshold and said third threshold are programmable.

12. The apparatus according to claim 11 , wherein said third circuit further comprises a low pass filter configured to filter said second digital signal and selected from the group consisting of an infinite impulse response (IIR) filter and a finite impulse response (FIR) filter.

13. A method for using a PRML read channel ADC for blank/defect and ripple detection comprising the steps of:

generating an RF signal in response to a laser spot on a surface of an optical disc;

generating a first digital signal in response to an AC-coupled version of said RF signal;

generating a second digital signal in response to a DC-coupled version of said RF signal;

generating a short term top holder and a short term bottom holder in response to said first digital signal and a programmable window; and

generating one or more detect signals in response to said short term top holder and said short term bottom holder, wherein each of said one or more detect signals indicates a respective condition of said surface of said optical disc.

14. The method according to claim 13 , wherein the step of generating said first digital signal comprises sampling said AC-coupled version of said RF signal using an analog-to-digital converter (ADC) circuit.

15. The method according to claim 13 , wherein the step of generating said second digital signal comprises the steps of:

low pass filtering said DC-coupled version of said RF signal; and

sampling said low pass filtered, DC-coupled version of said RF signal using an analog-to-digital converter (ADC) circuit.

16. The method according to claim 13 , wherein the step of generating said one or more detect signals further comprises the steps of:

generating a long term top holder and a long term bottom holder in response to said short term top holder and said short term bottom holder;

generating said one or more detect signals in response to said short term top holder, said short term bottom holder, said long term top holder, said long term bottom holder and one or more programmable threshold ratios.

17. The method according to claim 16 , wherein the step of generating said one or more detect signals further comprises generating a first intermediate signal in response to said short term top holder, said short term bottom holder, said long term top holder, said long term bottom holder and said one or more programmable threshold ratios.

18. The method according to claim 17 , wherein the step of generating said one or more detect signals further comprises:

generating a blank detect signal and a defect detect signal in response to said first intermediate signal and a second intermediate signal; and

generating said second intermediate signal in response to said second digital signal.

19. An apparatus comprising:

a photo detector circuit configured to generate a radio frequency (RF) signal in response to a laser spot on a surface of an optical disc;

a first circuit configured to generate a first digital signal in response to an AC-coupled version of said RF signal;

a second circuit configured to generate a second digital signal in response to a DC-coupled version of said RF signal; and

a third circuit configured to generate one or more detect signals in response to said first digital signal and said second digital signal, wherein each of said one or more detect signals indicates a respective condition of said surface of said optical disc and said third circuit comprises (i) a programmable low pass filter configured to determine a long term top value and a long term bottom value of said first digital signal in response to a plurality of short term top values and a plurality of short term bottom values determined using a programmable window and (ii) a threshold circuit configured to generate a first threshold and a second threshold in response to said long term top value and said long term bottom value of said first digital signal and one or more programmable threshold ratios.

20. An apparatus comprising:

a photo detector circuit configured to generate a radio frequency (RF) signal in response to a laser spot on a surface of an optical disc;

a first circuit configured to generate a first digital signal in response to an AC-coupled version of said RF signal;

a second circuit configured to generate a second digital signal in response to a DC-coupled version of said RF signal; and

a third circuit configured to generate a plurality of detect signals in response to said first digital signal and said second digital signal, wherein each of said plurality of detect signals indicates a respective condition of said surface of said optical disc, said third circuit comprising (i) a first comparator circuit configured to generate one of said plurality of detect signals and a first intermediate signal in response to a short term top value, a short term bottom value, a first threshold and a second threshold, (ii) a second comparator circuit configured to generate a second intermediate signal in response to said second digital signal and a third threshold and (iii) a logic circuit configured to generate at least one other of said plurality of detect signals in response to said first and said second intermediate signals, wherein said first threshold, said second threshold and said third threshold are programmable.

21. The apparatus according to claim 20 , wherein said third circuit further comprises a low pass filter configured to filter said second digital signal and selected from the group consisting of an infinite impulse response (IIR) filter and a finite impulse response (FIR) filter.

Assignments (7)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
MERGER Recorded Dec 1, 2009
From: LSI LOGIC CORPORATION
To: LSI CORPORATION
Reel/Frame 023585/0936 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2005
From: ZHOU, TING; LICONA, ESTUARDO; HONG, JU HI JOHN
To: LSI LOGIC CORPORATION
Reel/Frame 017389/0753 →
Continuity (1)
Related Publication 20070143771A1 · Jun 21, 2007