Mass spectrometry calibration methods
View Patent ↗Briefly described, embodiments of this disclosure include methods of calibrating a mass spectrometry system, and the like. One exemplary method of calibrating a mass spectrometry system, among others, includes: acquiring a first mass spectrum of a sample using a first trapping potential, wherein the first mass spectrum is acquired from a low ion population, wherein the first mass spectrum includes a first set of mass ion values; and acquiring a second mass spectrum of the sample using a second trapping potential, wherein the second mass spectrum is acquired from a high ion population, wherein the second mass spectrum includes a second set of mass ion values, wherein the first trapping potential is lower than the second trapping potential, wherein the first set of mass ion values is more accurate than the second set of mass ion values, wherein the second set of ion values has a greater signal-to-noise value and a greater detection dynamic range than the first set of mass values, and wherein the first set of mass values is used to calibrate the second set of mass values.
1. A method of calibrating a mass spectrometry system, comprising:
acquiring a first mass spectrum of a sample using a first trapping potential, wherein the first mass spectrum are acquired from a low ion population, wherein the first mass spectrum include a first set of mass ion values; and
acquiring a second mass spectrum of the sample using a second trapping potential, wherein the second mass spectrum is acquired from a high ion population, wherein the second mass spectrum includes a second set of mass ion values,
wherein the first trapping potential is lower than the second trapping potential, wherein the first set of mass ion values are more accurate than the second set of mass ion values, wherein the second set of ion values have a greater signal-to-noise value and a greater detection dynamic range than the first set of mass values, and wherein the first set of mass values are used to calibrate the second set of mass values.
2. The method of calibrating a mass spectrometry system of claim 1 , further comprising:
adjusting mass accuracy for local space-charge effects using a calibration equation.
3. The method of calibrating a mass spectrometry system of claim 1 , wherein the mass spectrometry system is selected from an ion trap mass analyzer system (IT-MS), an ion cyclotron resonance mass analyzer system (ICR-MS), and an orbitrap system.
4. The method of calibrating a mass spectrometry system of claim 3 , wherein the mass analysis system is the ICR-MS, and wherein the first trapping potential is from about 0 to 0.75 V and the second trapping potential is from about 0.75 to 5 V.
5. The method of calibrating a mass spectrometry system of claim 1 , wherein high ion population is an order of magnitude greater than the low ion population.