IP Library Granted Patent US 7,705,762
Granted Patent B2
US 7,705,762 · App. 12/332,168 · Granted Apr 27, 2010

Voltage random access memory (VRAM)

Assignee: Kenet Incorporated
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Quick Facts
Patent No.
US 7,705,762
App. No.
12/332,168
Granted
Apr 27, 2010
Kind
B2
Abstract

An integrated circuit memory cell and voltage ladder design that adapts techniques typically applied to Static Random Access Memory (SRAM) circuits to implement a compact array of analog Voltage Random Access Memory (VRAM) locations. The memory cells in the VRAM each store a digital value that controls a corresponding switch. The switch couple a particular voltage from a set of voltages generated by the ladder, to be output when that location is enabled. Multiple analog output voltages are provided by simply providing additional rows of cells.

Claims (46)

1. A method for causing a particular analog voltage to be output at an output node, the method comprising:

providing a set of analog reference voltages at respective reference nodes;

storing digital bits in an array of memory cells; and

selectively coupling one or more of the analog reference voltages to the output node, the selective coupling of a given analog reference voltage depending upon a value of a respective one of the digital bits stored in a corresponding memory cell.

2. The method of claim 1 wherein the step of providing a set of analog reference voltages further comprises:

providing the set of analog reference voltages at a respective plurality of reference nodes in a resistive voltage ladder.

3. The method of claim 1 wherein the step of selectively coupling further comprises:

depending upon the value of the digital bits in a respective memory cell, controlling an open or closed state of a switch disposed between each reference node and the output node.

4. The method of claim 3 wherein the memory cells are arranged as an addressable array.

5. The method of claim 4 wherein the step of storing digital bits further comprises:

addressing a selected memory cell; and

storing a digital value in the memory cells in response to the addressing step, the digital value representative of desired states for the respective switches.

6. The method of claim 3 that further outputs a plurality of selectable analog output voltages comprising:

controlling an open or closed state of two or more switches disposed between each reference node and a respective one of a plurality of output nodes; and

coupling each of the plurality of output nodes to provide a respective one of the selectable analog output voltages.

7. The method of claim 2 wherein the resistive voltage ladder is further arranged as a first set of resistors connected in series to provide the set of reference analog voltages.

8. The method of claim 7 additionally wherein the resistive voltage ladder further comprises additional resistors arranged in parallel with one or more of the resistors in the first set to provide one or more fine reference analog voltages.

9. The method of claim 1 additionally comprising:

storing, in a first memory cell, digital information to produce a coarse analog voltage;

storing, in a second memory cell, digital information to produce a fine analog voltage; and

producing, via a difference amplifier connected to receive the coarse analog voltage and the fine analog voltage, the analog output as a voltage or current proportional to a difference therebetween.

10. A method for converting charge to voltage in a serial pipeline register, comprising:

comparing, at a first stage of the serial pipeline register, a voltage corresponding to charge of a charge packet against a first reference voltage provided by a first combination of nodes of a voltage ladder;

transferring the charge packet from the first stage of the serial pipeline register to a second stage of the serial pipeline register;

comparing, at the second stage, a voltage corresponding to charge of the charge packet against a second reference voltage, the second reference voltage provided by a second combination of nodes of the same voltage ladder used to generate the first reference voltage, and wherein the first and second combination of nodes used to generate the first and second reference voltages are each selected depending upon a value of a respective digital bit stored in a corresponding memory cell.

11. An apparatus that provides a particular analog voltage at an output node, the apparatus comprising:

a set of reference nodes that provide a set of respective analog reference voltages;

an array of memory cells that store digital bits; and

a set of switches, for selectively coupling one or more of the analog reference voltages to the output node, the switches controlled by a respective one of the digital bits stored in a corresponding one of the memory cells.

12. The apparatus of claim 11 wherein the set of reference nodes further comprises a resistive voltage ladder.

13. The apparatus of claim 11 further comprising:

a controller that, depending upon the value of the digital bits in a respective memory cell, controls an open or closed state of a switch disposed between each reference node and the output node.

14. The apparatus of claim 13 wherein the memory cells are arranged as an addressable array of memory cells.

15. The apparatus of claim 14 wherein the digital bits stored in the memory cells are representative of desired states for the respective switches.

16. The apparatus of claim 13 that additionally outputs a plurality of selectable analog output voltages, and the controller further controls an open or closed state of two or more switches disposed between each reference node and a respective one of a plurality of output nodes.

17. A apparatus as in claim 12 wherein the resistive voltage ladder is further arranged as a first set of resistors connected in series to provide the set of reference analog voltages.

18. A apparatus as in claim 17 additionally wherein the resistive voltage ladder further comprises additional resistors arranged in parallel with one or more of the resistors in the first set to provide one or more fine reference analog voltages.

19. An apparatus as in claim 11 additionally wherein

a first memory cell stores digital bits to produce a coarse analog voltage and a second memory cell stores digital bits to produce a fine analog voltage; and

a difference amplifier connected to receive the coarse analog voltage and the fine analog voltage produces the analog output.

20. A serial pipeline converter for converting charge to a voltage comprising:

a first stage of the serial pipeline register, connected to compare a voltage corresponding to charge of a charge packet against a first reference voltage provided by a first combination of nodes of a voltage ladder;

a charge transfer device, connected to transfer the charge packet from the first stage of the serial pipeline register to a second stage of the serial pipeline register;

the second stage connected to compare a voltage corresponding to charge of the charge packet against a second reference voltage, the second reference voltage provided by a second combination of nodes of the same voltage ladder used to generate the first reference voltage;

a plurality of memory cells; and

wherein the first and second combination of nodes used to generate the first and second reference voltages are each selected depending upon a value of a respective digital bit stored in a corresponding memory cell.

Assignments (2)
SECURITY AGREEMENT Recorded Apr 29, 2010
From: INTERSIL CORPORATION; TECHWELL, INC.; INTERSIL COMMUNICATIONS, INC.; QUELLAN, INC.; ZILKER LABS, INC.; KENET, INC.; INTERSIL AMERICAS INC.; ELANTEC SEMICONDUCTOR, INC.; D2AUDIO CORPORATION; PLANET ATE, INC.
To: MORGAN STANLEY & CO. INCORPORATED
Reel/Frame 024312/0163 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2008
From: ANTHONY, MICHAEL P.; KUSHNER, LAWRENCE J.
To: KENET INCORPORATED
Reel/Frame 021991/0087 →
Continuity (4)
Continuation 1164970400 · Jan 4, 2007
Continuation In Part PCTUS200502413700 · Jul 6, 2005
Provisional Application 6058561000 · Jul 6, 2004
Related Publication 20090085787A1 · Apr 2, 2009