IP Library Granted Patent US 7,777,979
Granted Patent B2
US 7,777,979 · App. 12/256,202 · Granted Aug 17, 2010

Magnetic disk device testing method and testing device

Assignee: Toshiba Storage Device Corporation
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Quick Facts
Patent No.
US 7,777,979
App. No.
12/256,202
Granted
Aug 17, 2010
Kind
B2
Abstract

A magnetic disk device testing method includes obtaining index values indicating the signal quality of an adjacent track at different positions scattered in the width direction in the adjacent track located in the vicinity of a target track on a magnetic disk after repeatedly writing data onto the target track, and determining a representative value of the index values indicating the signal quality of the adjacent track based on the obtained results, while incrementing the number of data write times; and estimating an index value indicating the signal quality of the adjacent track to be obtained where data is written onto the target track a larger number of times than the total number of data write times the data has been actually written in obtaining the index values, the index value being estimated with the use of the representative values decided in the representative value deciding.

Claims (10)

1. A method for testing a magnetic disk device, the method comprising:

obtaining index values indicating signal quality of an adjacent track at different positions scattered in a width direction in the adjacent track located in the vicinity of a target track on a magnetic disk after repeatedly writing data onto the target track, and determining a representative value of the index values indicating the signal quality of the adjacent track based on the obtained results, while incrementing the number of data write times; and

estimating an index value indicating signal quality of the adjacent track to be obtained where data is written onto the target track a larger number of times than the total number of data write times the data has been actually written in obtaining the index values, the index value being estimated with the use of a plurality of representative values decided in the representative value deciding.

2. The method as claimed in claim 1 , wherein estimating the index value includes estimating the index value by performing curve approximation of the plurality of representative values obtained in the representative value deciding.

3. The method as claimed in claim 1 , further comprising determining whether the index value estimated in estimating the index value is larger than a predetermined threshold value.

4. The method as claimed in claim 3 , wherein the threshold value varies depending on proximity of the adjacent track to the target track.

5. A device for testing a magnetic disk device, comprising:

a data acquiring unit that obtains data about an adjacent track at different locations scattered in a width direction in the adjacent track located in the vicinity of a target track with the use of a read head of the magnetic disk device, after repeatedly writing data onto the target track on the magnetic disk with the use of a write head of the magnetic disk device;

a representative value deciding unit that obtains index values about signal quality from the data obtained by the data acquiring unit, and decides a representative value of the index values in the adjacent track; and

an estimating unit that estimate an index value about signal quality to be obtained where data is written a larger number of times than the total number of data write times the data has been actually written onto the target track, using the representative values decided by the representative value deciding unit with respect to different numbers of write times.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2012
From: TOSHIBA STORAGE DEVICE CORPORATION
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 027674/0352 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2009
From: FUJITSU LIMITED
To: TOSHIBA STORAGE DEVICE CORPORATION
Reel/Frame 023565/0179 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2008
From: SUZUKI, KATSUJI; YAMAZAKI, YUICHIRO
To: FUJITSU LIMITED
Reel/Frame 021722/0176 →
Priority Claims (1)
JP 2008-067445 · Mar 17, 2008 · national
Continuity (1)
Related Publication 20090231744A1 · Sep 17, 2009