Cantilevers with integrated actuators for probe microscopy

1. An atomic force microscopy sensor, comprising:

a. a substrate, a portion of which is transparent;

b. a cantilever beam having a proximal end and an opposite distal end, the proximal end in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate;

c. an electrostatic actuator that includes a first electrode that is coupled to the cantilever beam adjacent to the proximal end and a spaced apart second electrode that is affixed to the substrate, so that when an electrical potential is applied between the first electrode and the second electrode, the first electrode is drawn to the second electrode, thereby causing the distal end of the cantilever beam to move;

d. a probe extending from the distal end of the cantilever beam;

e. a diffraction grating disposed on the substrate; and

f. a reflective surface disposed on the cantilever beam in a location so that when a beam of electromagnetic radiation is directed to the reflective surface, a reflected beam interacts with the diffraction grating so as to form a diffraction pattern that is indicative of a displacement between the cantilever beam and the substrate.

2. The atomic force microscopy sensor of claim 1 , wherein the diffraction grating is formed by the first electrode and the reflective surface is formed by the second electrode.

3. The atomic force microscopy sensor of claim 1 , further comprising:

a. a third electrode that is coupled to the cantilever beam and spaced apart from the first electrode; and

b. a fourth electrode that is in a fixed relationship to the substrate and spaced apart from the third electrode,

the third electrode and the fourth electrode disposed so as to form a capacitor so that a displacement between the third electrode and the fourth electrode results in a corresponding capacitance that is indicative of a displacement of the distal end of the cantilever beam.

4. The atomic force microscopy sensor of claim 1 , wherein the probe is mounted on a membrane coupled to the distal end of the cantilever beam.

5. The atomic force microscopy sensor of claim 1 , further comprising a piezoelectric actuator that includes a piezoelectric member affixed to the cantilever beam adjacent to the proximal end so that when an electrical potential is applied to the piezoelectric member, the piezoelectric member will deform along a predetermined dimension, thereby causing the cantilever beam to bend.

6. The atomic force microscopy sensor of claim 1 , wherein the substrate defines a passage that opens into the chamber that is configured to allow application of a gas to the chamber so as to create a positive pressure in the chamber relative to a fluid into which the sensor is placed.

7. The atomic force microscopy sensor of claim 1 , further comprising a frame depending from a portion of the cantilever beam adjacent to the proximal end, the frame including:

a. a longitudinal structure affixed to the cantilever beam; and

b. rigid beam, extending laterally from the longitudinal structure so as to be spaced apart from the cantilever beam and to define a gap therebetween, upon which the second electrode is disposed.

8. An atomic force microscopy sensor, comprising:

a. a substrate;

b. a cantilever beam having a proximal end and an opposite distal end, the proximal end in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate;

c. an electrostatic actuator that includes a first electrode that is coupled to the cantilever beam adjacent to the proximal end and a spaced apart second electrode that is affixed to the substrate, so that when an electrical potential is applied between the first electrode and the second electrode, the first electrode is drawn to the second electrode, thereby causing the distal end of the cantilever beam to move;

d. a probe extending from the distal end of the cantilever beam;

e. a sealing membrane disposed between a portion of the cantilever beam and a portion of the substrate so as to define a chamber that encloses the first electrode and the second electrode, the chamber filled with a non-conductive gas, the sealing membrane configured to prevent liquids from entering the chamber.

9. The atomic force microscopy sensor of claim 8 , wherein the substrate defines a passage that opens into the chamber that is configured to allow application of a gas to the chamber so as to create a positive pressure in the chamber relative to a fluid into which the sensor is placed.

10. The atomic force microscopy sensor of claim 8 , wherein the diffraction grating is formed by the first electrode and the reflective surface is formed by the second electrode.

11. The atomic force microscopy sensor of claim 8 , further comprising:

a. a third electrode that is coupled to the cantilever beam and spaced apart from the first electrode; and

b. a fourth electrode that is in a fixed relationship to the rigid beam and spaced apart from the third electrode,

the third electrode and the fourth electrode disposed so as to form a capacitor so that a displacement between the third electrode and the fourth electrode results in a corresponding capacitance that is indicative of a displacement of the distal end of the cantilever beam.

12. The atomic force microscopy sensor of claim 8 , wherein the cantilever beam comprises a V-shaped structure that includes a first leg and a spaced apart second leg, both legs coupled to the substrate, and wherein the electrostatic actuator comprises a first member that is coupled to the first leg and a second member that is coupled to the second leg, the first member configured to drive movement of the first leg and the second member configured to drive movement of the second leg.

13. The atomic force microscopy sensor of claim 8 , further comprising a piezoelectric actuator that includes a piezoelectric member affixed to the cantilever beam adjacent to the proximal end so that when an electrical potential is applied to the piezoelectric member, the piezoelectric member will deform along a predetermined dimension, thereby causing the cantilever beam to bend.

14. An atomic force microscopy sensor, comprising:

a. a substrate;

b. a cantilever beam, a portion of which is transparent, having a proximal end and an opposite distal end, the proximal end in a fixed relationship with the substrate and the cantilever beam is configured so that the distal end is in a moveable relationship with respect to the substrate;

c. an electrostatic actuator that includes a first electrode that is coupled to the cantilever beam adjacent to the proximal end and a spaced apart second electrode that is in a fixed relationship with the substrate, so that when an electrical potential is applied between the first electrode and the second electrode, the first electrode is drawn to the second electrode, thereby causing the distal end of the cantilever beam to move;

d. a probe extending from the distal end of the cantilever beam;

e. a frame depending from a portion of the cantilever beam adjacent to the proximal end, the frame including:

i. a longitudinal structure affixed to the cantilever beam; and

ii. rigid beam, extending laterally from the longitudinal structure so as to be spaced apart from the cantilever beam and to define a gap therebetween, upon which the second electrode is disposed; and

f. a diffraction grating disposed on the portion of the cantilever beam; and

g. a reflective surface disposed on the rigid beam in a location so that when a beam of electromagnetic radiation is directed to the reflective surface, a reflected beam interacts with the diffraction grating so as to form a diffraction pattern that is indicative of a displacement between the cantilever beam and the rigid beam.

15. The atomic force microscopy sensor of claim 14 , wherein the diffraction grating is formed by the first electrode and the reflective surface is formed by the second electrode.

16. The atomic force microscopy sensor of claim 14 , further comprising:

a. a third electrode that is coupled to the cantilever beam and spaced apart from the first electrode; and

b. a fourth electrode that is in a fixed relationship to the rigid beam and spaced apart from the third electrode,

the third electrode and the fourth electrode disposed so as to form a capacitor so that a displacement between the third electrode and the fourth electrode results in a corresponding capacitance that is indicative of a displacement of the distal end of the cantilever beam.

17. The atomic force microscopy sensor of claim 14 , wherein the cantilever beam comprises a V-shaped structure that includes a first leg and a spaced apart second leg, both legs coupled to the substrate, and wherein the electrostatic actuator comprises a first member that is coupled to the first leg and a second member that is coupled to the second leg, the first member configured to drive movement of the first leg and the second member configured to drive movement of the second leg.

18. The atomic force microscopy sensor of claim 14 , wherein the probe is mounted on a membrane coupled to the distal end of the cantilever beam.

19. The atomic force microscopy sensor of claim 14 , further comprising a sealing membrane disposed between a portion of the cantilever beam and a portion of the substrate so as to define a chamber that encloses the first electrode and the second electrode, the chamber filled with a non-conductive gas, the sealing membrane configured to prevent liquids from entering the chamber.

20. The atomic force microscopy sensor of claim 19 , wherein the substrate defines a passage that opens into the chamber that is configured to allow application of a gas to the chamber so as to create a positive pressure in the chamber relative to a fluid into which the sensor is placed.