Conductive material for a connecting part
Disclosed is a conductive material for a connecting part, including: a base material made up of a Cu strip; a Cu—Sn alloy covering layer having an average thickness of 0.2 to 3.0 μm; and an Sn covering layer, the Cu—Sn alloy covering layer being provided between the base material and the Sn covering layer, wherein in a cross section perpendicular to the surface of the conductive material, the diameter [D 1] of the minimum inscribed circle of the Sn covering layer is 0.2 μm or less, the diameter [D 2] of the maximum inscribed circle of the Sn covering layer is 1.2 to 20 μm, the difference in elevation [y] between the outermost point of the material and the outermost point of the Cu—Sn alloy covering layer is 0.2 μm or less, and a bright or semi-bright tin electroplating layer having an average thickness of 0.01 μm or more in an approximately uniform thickness is formed on the outermost layer as part of the Sn covering layer.
1. A conductive material for a connecting part, comprising: a base material made up of a Cu strip;
a Cu—Sn alloy covering layer having an average thickness of 0.2 to 3.0 μm; and
an Sn covering layer, the Cu—Sn alloy covering layer being provided between the base material and the Sn covering layer,
wherein in a cross section perpendicular to the surface of the conductive material, D 1 is the diameter of a minimum inscribed circle of the Sn covering layer and is drawn between the surface of the Cu—Sn alloy covering layer and the outermost surface of the material; D 2 is the diameter of a maximum inscribed circle of the Sn covering layer, the diameter [D 1 ] of the minimum inscribed circle of the Sn covering layer is 0.01 to 0.2 μm, the diameter [D 2 ] of the maximum inscribed circle of the Sn covering layer is 1.2 to 20 μm, the difference in elevation [y] between the outermost point of the material and the outermost point of the Cu—Sn alloy covering layer is 0.01 to 0.2 μm, and a bright or semi-bright tin electroplating layer having an average thickness of 0.01 μm or more in an approximately uniform thickness is formed on the outermost [layer] surface as part of the Sn covering layer.
2. A conductive material for a connecting part according to claim 1 , wherein the Sn covering layer comprises a reflow Sn plated layer and the bright or semi-bright tin electroplating layer formed thereon.
3. A conductive material for a connecting part according to claim 1 , wherein an Ni covering layer having an average thickness of 0.1 to 3.0 μm if formed between the surface of the base material and the Cu—Sn alloy covering layer.
4. A conductive material for a connecting part according to claim 3 , wherein a Cu covering layer having an average thickness of 0.01 to 1.0 μm is formed between the Ni covering layer and the Cu—Sn alloy covering layer.
5. A conductive material for a connecting part according to claim 4 , wherein the Cu covering layer has an average thickness of 0.01 to 0.5 μm.
6. A conductive material for a connecting part according to claim 3 , wherein the average thickness of the Ni covering layer is 0.2 to 2.0 μm.
7. A conductive material for a connecting part according to claim 1 , wherein a Cu covering layer having an average thickness of 0.01 to 1.0 μm is formed between the surface of the base material and the Cu—Sn alloy covering layer.
8. A conductive material for a connecting part according to claim 7 , wherein the Cu covering layer has an average thickness of 0.01 to 0.5 μm.
9. A conductive material for a connecting part according to claim 1 , wherein the Cu—Sn alloy covering layer has an average thickness of 0.3 to 3.0 μm.
10. A conductive material for a connecting part according to claim 1 , wherein [D 1 ] is 0.01 to 0.15 μm.
11. A conductive material for a connecting part according to claim 1 , wherein [D 2 ] is 1.5 to 10 μm.
12. A conductive material for a connecting part according to claim 1 , wherein [y] is 0.01 to 0.15 μm.
13. A conductive material for a connecting part according to claim 1 , which comprises a bright or semi-bright tin electroplating layer having a uniform thickness on the outermost [layer] surface as part of the Sn covering layer.