Measuring energy contamination using time-of-flight techniques
View Patent ↗Techniques for measuring energy contamination using time-of-flight (TOF) sensor are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for detecting energy contamination in an ion beam using time-of-flight comprising directing an ion beam towards an entrance of a sensor, wherein the ion beam may include charged particles and neutral particles, blocking the ion beam periodically from entering the sensor and allowing a pulse of the ion beam to enter the sensor periodically using a gate mechanism, separating the charged particles and the neutral particles of the ion beam pulse based at least in part upon different transit times over a distance caused by variations in at least one of mass and energy associated with the charged particles and the neutral particles, and detecting at least one of the charged particles and the neutral particles separately at a detector based at least in part upon the different transit times.
1. A method for detecting energy contamination in an ion beam using time-of-flight comprising:
directing an ion beam towards an entrance of a sensor, wherein the ion beam includes charged particles and neutral particles;
completely blocking the ion beam from entering the sensor;
measuring a background signal while the ion beam is completely blocked;
blocking the ion beam periodically from entering the sensor with an electrostatic gate and allowing a pulse of the ion beam to enter the sensor periodically using the electrostatic gate;
separating the charged particles and the neutral particles of the ion beam pulse based at least in part upon different transit times of the charged particles and the neutral particles over a distance caused by variations in at least one of mass and energy associated with the charged particles and the neutral particles; and
detecting at least one of the charged particles and the neutral particles separately at a detector based at least in part upon the different transit times.
2. The method according to claim 1 , further comprising outputting a signal from the detector and adjusting one or more variables associated with the ion beam based at least in part on the signal from the detector.
3. The method according to claim 2 , wherein the adjusting one or more variables associated with the ion beam further comprises stopping implantation of the ion beam when a detected energy contamination level is above a predetermined energy contamination value.
4. A method for detecting energy contamination in an ion beam using time-of-flight comprising:
directing an ion beam towards an entrance of a sensor, wherein the ion beam includes charged particles and neutral particles;
completely blocking the ion beam from entering the sensor;
measuring a background signal while the ion beam is completely blocked;
detecting the neutral particles in the ion beam by preventing the charged particles from entering the sensor using an electrostatic gate; and
detecting both the charged particles and neutral particles.
5. The method according to claim 4 , further comprising outputting a signal from the detector and adjusting one or more variables associated with the ion beam based at least in part on the signal from the detector.
6. The method according to claim 5 , wherein the adjusting one or more variables associated with the ion beam further comprises stopping implantation of the ion beam when a detected energy contamination level is above a predetermined energy contamination value.