IP Library Granted Patent US 7,933,147
Granted Patent B2
US 7,933,147 · App. 11/968,041 · Granted Apr 26, 2011

Sensing circuit of a phase change memory and sensing method thereof

Assignee: Industrial Technology Research Institute
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Quick Facts
Patent No.
US 7,933,147
App. No.
11/968,041
Granted
Apr 26, 2011
Kind
B2
Abstract

A sensing circuit of a phase change memory. The sensing circuit comprises a data current source and a reference current source, a storage memory device and a reference memory device, a storage switch and a reference switch, an auxiliary current source and a comparator. First terminals of the storage memory device and the reference memory device are respectively coupled to the data current source and the reference current source. The storage switch and the reference switch are respectively coupled to second terminals of the storage memory device and the reference memory device. The auxiliary current source is dynamically coupled to the first terminals of the storage memory device and the reference memory device. The comparator is coupled to the first terminals of the storage memory device and the reference memory device.

Claims (10)

1. A sensing circuit of a phase change memory, comprising:

a data current source and a reference current source;

a storage memory device and a reference memory device having first terminals respectively coupled to the data current source and the reference current source;

a storage switch and a reference switch respectively coupled to second terminals of the storage memory device and the reference memory device;

an auxiliary current source dynamically coupled to the first terminals of the storage memory device and the reference memory device; and

a comparator coupled to the first terminals of the storage memory device and the reference memory device.

2. The sensing circuit of a phase change memory as claimed in claim 1 , wherein the storage memory device and the reference memory device are phase change memory devices.

3. The sensing circuit of a phase change memory as claimed in claim 1 , wherein the auxiliary current source is coupled to the first terminal of the storage memory device or the reference memory device via a switch.

4. The sensing circuit of a phase change memory as claimed in claim 3 , wherein the switch is turned on when read process starts and turned off within a predetermined period.

5. The sensing circuit of a phase change memory as claimed in claim 1 , wherein the storage switch and the reference switch are MOS transistors, BJTs, or diodes.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2026
From: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
To: HIGGS OPL. CAPITAL LLC
Reel/Frame 075733/0186 →
MERGER Recorded Dec 26, 2015
From: HIGGS OPL. CAPITAL LLC
To: GULA CONSULTING LIMITED LIABILITY COMPANY
Reel/Frame 037360/0803 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2011
From: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
To: HIGGS OPL. CAPITAL LLC
Reel/Frame 027364/0397 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2010
From: POWERCHIP SEMICONDUCTOR CORP.; NANYA TECHNOLOGY CORPORATION; PROMOS TECHNOLOGIES INC.; WINBOND ELECTRONICS CORP.
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 024149/0102 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2007
From: LIN, LIEH-CHIU; SHEU, SHYH-SHYUAN; CHIANG, PEI-CHIA
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE; POWERCHIP SEMICONDUCTOR CORP.; NANYA TECHNOLOGY CORPORATION; PROMOS TECHNOLOGIES INC.; WINBOND ELECTRONICS CORP.
Reel/Frame 020313/0650 →
Priority Claims (1)
TW 96122876 A · Jun 25, 2007 · national
Continuity (1)
Related Publication 20080316803A1 · Dec 25, 2008