IP Library Granted Patent US 7,948,607
Granted Patent B2
US 7,948,607 · App. 12/158,392 · Granted May 24, 2011

Immersion lithography apparatus and method of performing immersion lithography

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Quick Facts
Patent No.
US 7,948,607
App. No.
12/158,392
Granted
May 24, 2011
Kind
B2
Abstract

An immersion lithography apparatus includes an optical system having a liquid delivery unit. The liquid delivery unit is arranged to deliver a layer of an immersion liquid onto a surface of a wafer as well as an annulus of a barrier liquid adjacent an exterior wall of the immersion liquid. The presence of the barrier liquid prevents ingress to the immersion liquid of a gas external to the immersion liquid.

Claims (30)

1. An immersion lithography apparatus comprising:

an optical system for projecting a pattern onto a part of a surface of a wafer, the optical system having a liquid delivery unit arranged to dispose, when in use, a quantity of an immersion liquid for filling a space between the optical system and the surface of the wafer, the liquid delivery unit having a lower horizontal surface defining a clearance between the lower horizontal surface and the surface of the wafer, the liquid delivery unit including a first port for deploying the quantity of the immersion liquid and including a second port for deploying a quantity of a barrier liquid, the second port to dispense into the clearance;

a carrier unit for carrying the wafer, the carrier unit being arranged to move, when in use, relative to the optical system for exposing different parts of the surface of the wafer to the pattern; and

a source of the barrier liquid arranged to provide through the second port, when in use, the quantity of the barrier liquid adjacent and in contact with the quantity of the immersion liquid, thereby preventing ingress to the quantity of the immersion liquid of a gas external to the quantity of the barrier liquid, wherein the barrier liquid is hydrophobic and non-aqueous and has a density between about 700 kgm −3 and about 1600 kgm −3 .

2. An apparatus as claimed in claim 1 , wherein the quantity of the immersion liquid has a leading edge when the carrier unit moves relative to the optical system, the quantity of the barrier liquid being disposed adjacent the leading edge of the quantity of the immersion liquid.

3. An apparatus as claimed in claim 1 , wherein the refractive index of the immersion liquid is between about 1.5 and about 1.8.

4. An apparatus as claimed in claim 1 , wherein the refractive index of the immersion liquid is between about 1.6 and about 1.7.

5. An apparatus as claimed in claim 1 , wherein a density of the barrier liquid is of a value so that, when in use, the barrier liquid does not mix with the immersion liquid during the relative movement of the carrier unit.

6. An apparatus as claimed in claim 1 , wherein the immersion liquid rolls, when in use, and the quantity of barrier liquid prevents envelopment of the gas by the quantity of the immersion liquid as the immersion liquid rolls.

7. A method of performing immersion lithography, the method comprising the steps of:

disposing a quantity of an immersion liquid to fill a space between an optical system of an immersion lithography apparatus and a surface of a wafer, the optical system having a liquid delivery unit arranged to dispose, when in use, a quantity of the immersion liquid for filling the space between the optical system and the surface of the wafer, the liquid delivery unit having a lower horizontal surface defining a clearance between the lower horizontal surface and the surface of the wafer, the liquid delivery unit including a first port for deploying the quantity of the immersion liquid and including a second port for deploying a quantity of a barrier liquid, the second port to dispense into the clearance;

projecting a pattern onto a part of the surface of the wafer;

moving the wafer relative to the optical system for exposing different parts of the surface of the wafer to the pattern;

providing the quantity of the barrier liquid adjacent and in contact with the quantity of the immersion liquid, thereby preventing ingress to the quantity of the immersion liquid of a gas external to the quantity of the barrier liquid, wherein the barrier liquid is hydrophobic and non-aqueous and has a density between about 700 kgm −3 and about 1600 kgm −3 .

8. An apparatus as claimed in claim 2 , wherein the refractive index of the immersion liquid is between about 1.5 and about 1.8.

9. An apparatus as claimed in claim 2 , wherein the refractive index of the immersion liquid is between about 1.6 and about 1.7.

10. An apparatus as claimed in claim 2 , wherein a density of the barrier liquid is of a value so that, when in use, the barrier liquid does not mix with the immersion liquid during the relative movement of the carrier unit.

11. An apparatus as claimed in claim 3 , wherein a density of the barrier liquid is of a value so that, when in use, the barrier liquid does not mix with the immersion liquid during the relative movement of the carrier unit.

12. An apparatus as claimed in claim 4 , wherein a density of the barrier liquid is of a value so that, when in use, the barrier liquid does not mix with the immersion liquid during the relative movement of the carrier unit.

13. An apparatus as claimed in claim 1 , wherein the barrier liquid comprises dodecane.

14. A method of performing immersion lithography as claimed in claim 7 , wherein the barrier liquid is dodecane.

15. An immersion lithography apparatus comprising:

an optical system for projecting a pattern onto a part of a surface of a wafer, the optical system having a liquid delivery unit arranged to dispose, when in use, a quantity of an immersion liquid for filling a space between the optical system and the surface of the wafer;

a carrier unit for carrying the wafer, the carrier unit being arranged to move, when in use, relative to the optical system for exposing different parts of the surface of the wafer to the pattern; and

a source of the barrier liquid arranged to provide through the second port, when in use, a quantity of the barrier liquid adjacent and in contact with the quantity of the immersion liquid, thereby preventing ingress to the quantity of the immersion liquid of a gas external to the quantity of the barrier liquid when the carrier unit moves relative to the optical system at a rate above 500 mm/s, wherein the barrier liquid is hydrophobic and non-aqueous and has a density between about 700 kgm −3 and about 1600 kgm −3 .

16. The immersion lithography apparatus of claim 15 , wherein the barrier liquid is dodecane.

17. The immersion lithography apparatus of claim 15 , wherein the barrier liquid is oil.

18. An apparatus as claimed in claim 1 , wherein the barrier liquid comprises oil.

19. A method of performing immersion lithography as claimed in claim 7 , wherein the barrier liquid is oil.

20. An apparatus as claimed in claim 1 , wherein the immersion liquid is aqueous.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0719 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →