DC and RF hybrid processing system

1. A method of processing a substrate using a Direct Current (DC)/Radio Frequency (RF) Hybrid (DC/RFH) processing system, the method comprising:

receiving a first set of substrates by a transfer subsystem coupled to the DC/RFH processing system;

determining at least one first Electron Energy Distribution Function (EEDƒ) 1 data for a first substrate;

determining a first DC/RFH process recipe for the first substrate using the at least one (EEDƒ) 1 data;

processing the first substrate using the first DC/RFH process recipe;

obtaining process data for the first substrate;

determining risk data for the first set of substrates using process data for the first processed substrate;

comparing the risk data to processing limits;

processing additional substrates in the first set of substrates when the risk data does not exceed at least one of the processing limits; and

performing a corrective action when the risk data exceeds one or more of the processing limits.

2. The method of claim 1 , wherein the at least one first (EEDƒ) 1 data includes at least one of a Maxwellian component, a high-energy component, and a middle-energy component.

3. The method of claim 2 , wherein the middle-energy component is located between the Maxwellian component and the high-energy component, and the middle-energy component includes at least one middle-energy peak.

4. The method of claim 1 , wherein the first substrate includes at least one substrate layer having a semiconductor material therein or thereon, at least one dielectric layer having a low-k material therein or thereon, and at least mask layer having photoresist and/or anti-reflecting coating (ARC) therein or thereon.

5. The method of claim 1 , wherein the first DC/RFH process recipe is determined using at least one Maxwellian component, at least one high-energy component, or at least one middle-energy component, or any combination thereof.

6. The method of claim 5 , wherein the first DC/RFH process recipe is determined using at least one middle-energy peak in at least one middle-energy component.

7. The method of claim 1 , wherein the processing the first substrate further comprises:

positioning the first substrate on a substrate holder configured within a process chamber of the DC/RFH processing system;

providing at first process gas to a process region above the first substrate in the process chamber using a gas supply system coupled to an upper assembly configured within the process chamber;

providing a direct current (DC) voltage to a DC electrode in the upper assembly, wherein a DC supply subsystem is coupled to the DC electrode and is configured to provide the DC voltage to the DC electrode, the DC voltage ranges from about −2000.0 V DC to about 0.0 V DC ;

establishing a pressure within the process chamber, wherein a pressure control subsystem is coupled to the process chamber and is configured to control the pressure within the process chamber, the pressure within the process chamber varying between about 5 mTorr and about 400 mTorr when the first substrate is processed; and

applying a RF signal to a lower electrode configured in the substrate holder, wherein a RF generator is coupled to the lower electrode and is configured to apply the RF signal to the lower electrode to establish plasma in the process region.

8. The method of claim 7 , wherein the first process gas includes at least one fluorocarbon gas and at least one inert gas, a first fluorocarbon gas flow rate varying between approximately 10 sccm and approximately 50 sccm and a first inert gas flow rate varying between approximately 3 sccm and approximately 20 sccm, wherein the fluorocarbon gas comprises C 4 F 6 , C 4 F 8 , C 5 F 8 , CHF 3 , or CF 4 , or any combination thereof, and the inert gas comprises Argon (Ar), Helium (He), Krypton (Kr), Neon (Ne), Radon (Rn), or Xenon (Xe), or any combination thereof.

9. The method of claim 1 , wherein performing the corrective action further comprises:

establishing risk values for one or more additional substrates in the first set of substrates;

comparing the risk values for one or more of the additional substrates to additional risk limits;

continuing the processing, when one or more of the additional risk limits are met; and

stopping the processing, if one or more of the additional risk limits are not met.

10. A method of processing a substrate using a Direct Current (DC)/Radio Frequency (RF) Hybrid (DC/RFH) processing system, the method comprising:

selecting a first substrate from a first set of substrates received by the DC/RFH processing system;

determining first Electron Energy Distribution Function (EEDƒ) 1 data for the first substrate;

determining a first DC/RFH procedure and a first DC/RFH process recipe for the first substrate using the first (EEDƒ) 1 data;

processing the first substrate using first process parameters established for the first DC/RFH process recipe;

obtaining EEDƒ-related data in real-time for the first substrate using EEDƒ-related sensors configured within a process chamber for performing the processing of the first substrate;

comparing the EEDƒ-related data to EEDƒ-related limits;

allowing the DC/RFH procedure to continue when the EEDƒ-related data does not exceed at least one of the EEDƒ-related limits; and

performing a corrective action when the EEDƒ-related data exceeds one or more of the EEDƒ-related limits.

11. The method of claim 10 , wherein the first (EEDƒ) 1 data includes at least one of a Maxwellian component, a high-energy component, and a middle-energy component.

12. The method of claim 11 , wherein the middle-energy component is located between the Maxwellian component and the high-energy component, and the middle-energy component includes at least one middle-energy peak.

13. The method of claim 10 , wherein the first substrate includes at least one substrate layer having a semiconductor material therein or thereon, at least one dielectric layer having a low-k material therein or thereon, and at least mask layer having photoresist and/or anti-reflecting coating (ARC) therein or thereon.

14. The method of claim 10 , wherein the first DC/RFH process recipe is determined using at least one Maxwellian component, at least one high-energy component, or at least one middle-energy component, or any combination thereof.

15. The method of claim 14 , wherein the first DC/RFH process recipe is determined using at least one middle-energy peak in at least one middle-energy component.

16. The method of claim 10 , wherein the processing the first substrate further comprises:

positioning the first substrate on a substrate holder configured within the process chamber of the DC/RFH processing system;

providing at first process gas to a process region above the first substrate in the process chamber using a gas supply system coupled to an upper assembly configured within the process chamber;

providing a direct current (DC) voltage to a DC electrode in the upper assembly, wherein a DC supply subsystem is coupled to the DC electrode and is configured to provide the DC voltage to the DC electrode, the DC voltage ranges from about −2000.0 V DC to about 0.0 V DC ;

establishing a pressure within the process chamber, wherein a pressure control subsystem is coupled to the process chamber and is configured to control the pressure within the process chamber, the pressure within the process chamber varying between about 5 mTorr and about 400 mTorr when the first substrate is processed; and

applying a RF signal to a lower electrode configured in the substrate holder, wherein a RF generator is coupled to the lower electrode and is configured to apply the RF signal to the lower electrode to establish plasma in the process region.

17. The method of claim 16 , wherein the first process gas includes at least one fluorocarbon gas and at least one inert gas, a first fluorocarbon gas flow rate varying between approximately 10 sccm and approximately 50 sccm and a first inert gas flow rate varying between approximately 3 sccm and approximately 20 sccm, wherein the fluorocarbon gas comprises C 4 F 6 , C 4 F 8 , C 5 F 8 , CHF 3 , or CF 4 , or any combination thereof, and the inert gas comprises Argon (Ar), Helium (He), Krypton (Kr), Neon (Ne), Radon (Rn), or Xenon (Xe), or any combination thereof.

18. The method of claim 17 , wherein the substrate holder comprises dual backside gas elements coupled to a backside gas system and temperature control elements coupled to a temperature control system configured to establish a first edge temperature and a first center temperature for the first substrate, the first edge temperature and the first center temperature being between approximately −10 degrees Celsius and approximately 100 degrees Celsius.

19. The method of claim 10 , wherein the performing the corrective action further comprises:

obtaining new correct data from at least one super-Debye trap-period detector and/or at least one sub-Debye dump-period detector; and

modifying one of the first process parameters in real-time using the new correct data.