Random access memory with CMOS-compatible nonvolatile storage element
Embodiments provide systems, methods, and apparatuses with a plurality of row lines and column lines arranged in a matrix, and at least one memory cell having an access transistor and a CMOS-compatible non-volatile storage element coupled to the access transistor in series. The CMOS-compatible non-volatile storage element includes a node and is configured to hold a charge corresponding to a n-bit binary value where n is an integer greater than 1. The access transistor has a word line gate coupled to a row line, a first node coupled to a column line, a second node coupled to a storage node, with the storage node connected to said node of the CMOS-compatible non-volatile storage element. Access circuitry coupled to the memory cell is configured to activate the memory cell and sense a resulting current corresponding to the n-bit binary value.
1. A memory device, comprising:
a plurality of row lines and a plurality of column lines;
a memory cell comprising an access transistor and a CMOS-compatible non-volatile storage element comprising a control gate and coupled to the access transistor in series, wherein:
the CMOS-compatible non-volatile storage element is configured to hold a charge corresponding to a n-bit binary value, wherein n is an integer;
the access transistor comprises a word line gate coupled to one of the plurality of row lines, a first node, a second node, and a storage node;
the first node is coupled to one of the plurality of column lines; and
the storage node is coupled to the second node and to the CMOS-compatible non-volatile storage element; and
access circuitry coupled to the plurality of row lines and to the plurality of column lines, wherein the access circuitry is configured to, as part of a read operation:
set a first select voltage on the word line gate of the access transistor;
set a second select voltage on the control gate of the CMOS-compatible non-volatile storage element, wherein the first select voltage is greater than the second select voltage; and
sense a resultant current corresponding to the n-bit binary value;
wherein the access circuitry is further coupled to the control gate of the CMOS-compatible non-volatile storage element and to a drain line, and wherein the access circuitry is further configured to, as part of a write operation:
set one of the plurality of row lines to the first select voltage;
set the drain line to a programming voltage; and
set the control gate to the programming voltage.
2. The memory device of claim 1 , wherein the CMOS-compatible non-volatile storage element comprises a floating-gate-transistor, and wherein a source node of the floating-gate transistor is coupled to the storage node.
3. The memory device of claim 2 , wherein the floating-gate transistor further comprises a drain node coupled to the drain line.
4. The memory device of claim 3 , wherein the access circuitry is coupled to the control gate of the floating-gate transistor and to the drain line, and wherein the access circuitry is further configured to, as part of the read operation, set the drain line to a read voltage.
5. The memory device of claim 4 , wherein the access circuitry is further configured to determine, from the resultant current, the n-bit binary value.
6. The memory device of claim 5 , wherein the resultant current comprises 2 n possible current ranges, and wherein the access circuitry is configured to determine which of 2 n current ranges matches the resulting current.
7. The memory device of claim 3 , wherein the access circuitry is configured to, as part of the write operation, set the control gate to the programming voltage to store a charge on the floating-gate of the floating-gate transistor.
8. The memory device of claim 3 , wherein the access circuitry is further configured to, as part of an erase operation:
set one of the plurality of row lines to the first select voltage;
set the drain line to an erase voltage; and
set the control gate to the erase voltage to erase a charge on the floating-gate of the floating-gate transistor.
9. An article of manufacture, comprising a non-transitory computer-readable medium including a plurality of computer-readable hardware design language instructions, or compilation of the hardware design language instructions, wherein the hardware design language instructions specify an implementation of the apparatus as set forth in claim 1 as an integrated circuit.
10. The article of manufacture of claim 9 , wherein a hardware design language of the hardware design language instructions comprises either VHDL or Verilog.
11. A method of operating digital memory, the method comprising:
simultaneously setting by access circuitry of a digital memory device, as part of a read operation:
a first select voltage on a row line coupled to a word line gate of an access transistor of a memory cell of the digital memory device, the access transistor comprising a first node coupled to a column line and a second node coupled to a storage node; and
a second select voltage on a control gate of a floating-gate transistor configured to hold a charge corresponding to a n-bit binary value, wherein n is an integer, wherein the floating-gate transistor is coupled to the access transistor in series, wherein the floating-gate transistor comprises a drain node coupled to a drain line and a source node coupled to the storage node, and wherein the first select voltage is greater than the second select voltage;
sensing, by the access circuitry, a resultant current on the column line resulting from said simultaneous setting; and
determining, by the access circuitry, the n-bit binary value based at least on the sensed current;
wherein the access circuitry is further coupled to the control gate and to the drain line, and wherein the method further comprises, as part of a write operation:
setting, by the access circuitry, the row line to the first select voltage;
setting, by the access circuitry, the drain line to a programming voltage; and
setting, by the access circuitry, the control gate to the programming voltage.
12. The method of claim 11 , wherein n is equal to 1.
13. The method of claim 11 , wherein the first select voltage is equal to a supply voltage of the digital memory device.
14. The method of claim 11 , wherein n is an integer greater than or equal to 1 and the sensed current comprises 2 n possible current ranges, and wherein said determining comprises determining which of the 2 n possible current ranges that the sensed current matches.
15. A system, comprising:
a digital memory controller configured to issue access commands to a digital memory device; and
the digital memory device, coupled to the controller, wherein the digital memory device comprises:
a plurality of row lines and a plurality of column lines;
a memory cell comprising an access transistor and a CMOS-compatible non-volatile storage element comprising a control gate and coupled to the access transistor in series, wherein:
the CMOS-compatible non-volatile storage element is configured to hold a charge corresponding to a n-bit binary value, wherein n is an integer;
the access transistor comprises a word line gate, a first node, a second node, and a storage node;
the word line gate is coupled to one of the plurality of row lines, wherein the first node is coupled to one of the plurality of column lines; and
the storage node is coupled to the second node and to the CMOS-compatible non-volatile storage element; and
access circuitry coupled to the memory cell, wherein the access circuitry is configured to, as part of a read operation:
set a first select voltage on the word line gate of the access transistor;
set a second select voltage on the control gate of the CMOS-compatible non-volatile storage element, wherein the first select voltage is greater than the second select voltage; and
sense a resultant current corresponding to the binary value upon activation of the memory cell;
wherein the access circuitry is further coupled to the control gate of the CMOS-compatible non-volatile storage element and to a drain line, and wherein the access circuitry is further configured to, as part of a write operation:
set one of the plurality of row lines to the first select voltage;
set the drain line to a programming voltage; and
set the control gate to the programming voltage.
16. The system of claim 15 , wherein the CMOS-compatible non-volatile storage element comprises a floating-gate-transistor including a source node coupled to the storage node.
17. The system of claim 16 , wherein the floating-gate transistor further comprises a drain node coupled to the drain line.
18. The system of claim 17 , wherein:
the access circuitry is coupled to the plurality of row lines and to the plurality of column lines; and
the access circuitry is configured to set, as part of the read operation, the drain line to a read voltage.
19. The system of claim 18 , wherein the access circuitry is further configured to determine the n-bit binary value based at least on the sensed resultant current.
20. The system of claim 19 , wherein the resultant current comprises 2 n possible current ranges, and wherein the access circuitry is further configured to sense the resultant current and to determine which of 2 n current ranges the resultant current matches.
21. The system of claim 17 , wherein:
the floating-gate transistor comprises a floating-gate;
the access circuitry is coupled to the plurality of row lines and to the plurality of column lines; and
the access circuitry is configured to, as part of the write operation, store a charge onto the floating-gate of the floating-gate transistor.
22. The system of claim 17 , wherein:
the floating-gate transistor comprises a floating-gate;
the access circuitry is coupled to the plurality of row lines and to the plurality of column lines; and
the access circuitry is configured to, as part of an erase operation, set the one of the plurality of row lines to the first select voltage, the drain line to an erase voltage, and the control gate to the erase voltage to erase a charge on the floating-gate of the floating-gate transistor.