IP Library › Granted Patent US 8,019,040
Granted Patent B2
US 8,019,040 · App. 12/530,303 · Granted Sep 13, 2011

X-ray inspection device and production system

Assignee: Ishida Co., Ltd.
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Quick Facts
Patent No.
US 8,019,040
App. No.
12/530,303
Granted
Sep 13, 2011
Kind
B2
Abstract

An X-ray inspection device includes a conveying unit, an identification part, and an operation control part. The X-ray inspection device irradiates articles with X-rays while the article is being conveyed, and the article is inspected. The conveying unit is configured and arranged to convey the article. The identification part is configured and arranged to identify whether the article is a test piece or an end product. The operation control part is configured to set operation of the X-ray inspection device to a normal mode in which the article is determined to be defective or not defective when the article has been identified as an end product by the identification part, and to a test mode in which a state of the device is assessed when the article has been identified as a test piece by the identification part.

Claims (14)

1. An X-ray inspection device for irradiating an article with X-rays and inspecting the article while the article is being conveyed, the X-ray inspection device comprising:

a conveying unit configured and arranged to convey the article;

an identification part configured and arranged to identify whether the article is a test piece or an end product by determining whether a transmission image of the X-rays irradiated onto the article includes a pattern corresponding to a prescribed identification reference for identifying the test piece; and

an operation control part configured to set operation of the X-ray inspection device to a normal mode in which the article is determined to be defective or not defective when the article has been identified as an end product by the identification part, and to a test mode in which a state of the X-ray inspection device is assessed by comparing a prescribed portion of the transmission image of the X-rays corresponding to a test foreign matter with a threshold value when the article has been identified as a test piece by the identification part.

2. The X-ray inspection device as recited in claim 1 , further comprising

a first storage part configured and arranged to store the prescribed identification reference.

3. The X-ray inspection device as recited in claim 2 , further comprising

a registration part configured and arranged to execute a registration mode in which the prescribed identification reference is obtained from a reference transmission image of the X-rays with which a test piece is irradiated.

4. The X-ray inspection device as recited in claim 3 , further comprising

a second storage part configured and arranged to store the threshold value corresponding to the test foreign matter provided to the test piece in the registration mode.

5. The X-ray inspection device as recited in claim 1 , wherein

the identification part is configured and arranged to identify whether the article is a test piece or an end product based on a timing at which the article is conveyed.

6. A production system comprising the X-ray inspection device as recited in claim 1 , and a production machine disposed on an upstream side of the X-ray inspection device, wherein

the test piece is introduced in the production machine.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 8, 2009
From: KABUMOTO, TAKASHI; HIROSE, OSAMU
To: ISHIDA CO., LTD.
Reel/Frame 023201/0934 →
Priority Claims (1)
JP 2007-061443 · Mar 12, 2007 · national
Continuity (1)
Related Publication 20100135459A1 · Jun 3, 2010